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Microscopy and Microanalysis, 2005
Image quality (IQ) maps constructed from electron backscatter diffraction data provide useful visualizations of microstructure. The contrast in these maps arises from a variety of sources, including phase, strain, topography, and grain boundaries.
Stuart I, Wright, Matthew M, Nowell
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Image quality (IQ) maps constructed from electron backscatter diffraction data provide useful visualizations of microstructure. The contrast in these maps arises from a variety of sources, including phase, strain, topography, and grain boundaries.
Stuart I, Wright, Matthew M, Nowell
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V92 Rückstreuelektronenbeugung (EBSD)
2014Die heute als Electron backscatter diffraction (EBSD) bezeichnete Analysetechnik geht zuruck auf die Entdeckung der sog. Kikuchi‐Linien, die bereits 1928 von Nishikawa und Kikuchi im Transmissionselektronenmikroskop beobachtet wurden. Noch im selben Jahr beschrieben sie, dass solche Beugungslinien auch im Reflexionsmodus erfasst werden konnen – die ...
Eckard Macherauch, Hans-Werner Zoch
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Advanced analysis of 3D EBSD data obtained from FIB-EBSD tomography
Microscopy and Microanalysis, 2012Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.
Zaefferer, S., Konijnenberg, P.
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Transmission EBSD (t-EBSD) as Tool to Investigate Nanostructures in Superconductors
Journal of Superconductivity and Novel Magnetism, 2019The transmission electron backscatter diffraction (t-EBSD) technique has proven to be an indispensable tool for the analysis of microstructures of superconducting samples, both high-Tc samples (YBa2Cu3Oy, Bi2Sr2CaCu2O8) as well as MgB2 or iron-based materials.
A. Koblischka-Veneva +3 more
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Journal of Microscopy, 2008
SummarySpheres, or more usually spherical surfaces, are important in electron backscatter diffraction. Both electron backscatter patterns (EBSPs) and pole figure texture data are more accurately represented on the spherical surface, S2; and unit quaternions, which are the optimal method for orientation calculations, exist on the surface of the ...
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SummarySpheres, or more usually spherical surfaces, are important in electron backscatter diffraction. Both electron backscatter patterns (EBSPs) and pole figure texture data are more accurately represented on the spherical surface, S2; and unit quaternions, which are the optimal method for orientation calculations, exist on the surface of the ...
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2017
Das Verfahrensprinzip zur Herstellung von EBSD-Aufnahmen (S. KIKUCHI 1928) erfordert einen Punktstrahl sowie eine ebenfalls raumfest angeordnete, in Detektorrichtung meist um 70° geneigte Probe. Quasielastisch gestreute Elektronen, die unter dem Bragg‘schen Winkel auf die Netzebenen der Probe treffen, werden von diesen reflektiert und beschreiben einen
Jürgen Bauch, Rüdiger Rosenkranz
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Das Verfahrensprinzip zur Herstellung von EBSD-Aufnahmen (S. KIKUCHI 1928) erfordert einen Punktstrahl sowie eine ebenfalls raumfest angeordnete, in Detektorrichtung meist um 70° geneigte Probe. Quasielastisch gestreute Elektronen, die unter dem Bragg‘schen Winkel auf die Netzebenen der Probe treffen, werden von diesen reflektiert und beschreiben einen
Jürgen Bauch, Rüdiger Rosenkranz
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2020
This OSF project hosts a collection of MATLAB scripts developed for the analysis of Electron Backscatter Diffraction (EBSD) data, with a focus on microstructural and textural quantification in geological and materials science contexts.
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This OSF project hosts a collection of MATLAB scripts developed for the analysis of Electron Backscatter Diffraction (EBSD) data, with a focus on microstructural and textural quantification in geological and materials science contexts.
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EBSD-Based Dislocation Microscopy
Solid State Phenomena, 2010Recent advances in high-resolution electron backscatter diffraction (EBSD)-based microscopy are applied to the characterization of incompatibility structures near the grain boundaries (GBs) in polycrystals. The principal interest described here is recovery of geometrically-necessary dislocation (density) tensors, of the 2- and 3-D type, described by ...
Brent L. Adams +2 more
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