Results 201 to 210 of about 265,376 (237)
Portable 3D-printed electrochemiluminescence sensor for simultaneous glucose and lactate monitoring. [PDF]
Sci RepKulkarni AS +6 more
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First report of gastric muscle-retracting sign identification and endoscopic intermuscular dissection. [PDF]
EndoscopySorge A +6 more
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Area efficient approximate multiplier based on novel 4:2 compressors and error correction logic. [PDF]
Sci RepP KP, V NK.
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Rapid and Quantitative Detection of TNF-α in Human Tears Using a Portable Electrochemiluminescence-Based Device. [PDF]
Biosensors (Basel)Qu S +5 more
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Erratum: Smith et al., "α-Synuclein Phosphorylation Enhances Eosinophilic Cytoplasmic Inclusion Formation in SH-SY5Y Cells". [PDF]
J Neuroscieuropepmc +1 more source
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IEEE Micro, 1990
A joint development project that implemented Sun Microsystems' scalable processor architecture (Sparc) with Bipolar Integrated Technology's bipolar emitter-coupled logic (ECL) is described. The authors review both ECL technology and the features of BIT's ECL technique and discuss how board and cache considerations influenced the chip designs.
E.W. Brown +5 more
openaire +1 more source
A joint development project that implemented Sun Microsystems' scalable processor architecture (Sparc) with Bipolar Integrated Technology's bipolar emitter-coupled logic (ECL) is described. The authors review both ECL technology and the features of BIT's ECL technique and discuss how board and cache considerations influenced the chip designs.
E.W. Brown +5 more
openaire +1 more source
Electrochemiluminescence (ECL)
Chemical Reviews, 2004AbstractFor Abstract see ChemInform Abstract in Full Text.
openaire +2 more sources
IEE Proceedings E Computers and Digital Techniques, 1988
A procedure for describing an ECL circuit at the gate level is proposed. All voltages and currents which switch during circuit operation are described by logic variables, and thus the ‘stuck line’ model can be effectively applied to describe circuit failures.
MORANDI, Carlo +3 more
openaire +1 more source
A procedure for describing an ECL circuit at the gate level is proposed. All voltages and currents which switch during circuit operation are described by logic variables, and thus the ‘stuck line’ model can be effectively applied to describe circuit failures.
MORANDI, Carlo +3 more
openaire +1 more source