Results 61 to 70 of about 791,486 (291)

Micro-Faraday cup matrix detector for ion beam measurements in fusion plasmas

, 2019
Atomic Beam Probe (ABP) is an extension of the routinely used Beam Emission Spectroscopy (BES) diagnostic for plasma edge current fluctuation measurement at magnetically confined plasmas.
Anda, Gábor, Dunai, Dániel, Hacek, Pavel, Hegedűs, Sándor, Kádi, Jenő, Lampert, Máté, Leskó, Balázs, Nagy, Domonkos, Palánkai, Miklós, Réfy, Dániel Imre, Weinzettl, Valdimir, Zoletnik, Sándor   +11 more
core   +1 more source

Characteristics and Outcomes of Male Participants in a Multicenter Longitudinal Australian Study Cohort

Arthritis Care &Research, EarlyView.
Objective The aim of this study was to determine the differences in demographic, serologic, and clinical characteristics between male and female patients with systemic sclerosis (SSc) in an Australian cohort. Methods This was a retrospective observational study using data from the Australian Scleroderma Cohort Study.
Emily Lin, Dylan Hansen, Laura Ross, Gene‐Siew Ngian, Susanna Proudman, Gabor Major, Maryam Tabesh, Mandana Nikpour, Jennifer Walker, Lauren Host, Nava Ferdowsi, Alannah Quinlivan, Wendy Stevens, Joanne Sahhar, Diane Apostolopoulos   +14 more
wiley   +1 more source

ARTIFICIAL INTELLIGENT SYSTEM FOR MEASUREMENT OF HARMONIC POWERS

ASEAN Journal on Science and Technology for Development, 2017
The importance of the electric power quality (PQ) demands new methodologies and measurement tools in the power industry for the analysis and measurement of the basic electric magnitudes necessary.
Jovitha Jerome, P. Vinoth
doaj   +1 more source

Electric field emissions of FPGA chip based on gigahertz transverse electromagnetic cell modeling and measurements [PDF]

, 2016
Modern integrated circuits (ICs) are significant sources of undesired electromagnetic wave. Therefore, characterization of chip-level emission is essential to comply with EMC tests at the product level.
Chua, King Lee
core  

Oriented polar molecules in a solid inert-gas matrix: a proposed method for measuring the electric dipole moment of the electron

, 2017
We propose a very sensitive method for measuring the electric dipole moment of the electron using polar molecules embedded in a cryogenic solid matrix of inert-gas atoms.
Hessels, E. A., Horbatsch, M., Vutha, A. C.   +2 more
core   +2 more sources

A Robust Adaptive One‐Sample‐Ahead Preview Super‐Twisting Sliding Mode Controller

International Journal of Adaptive Control and Signal Processing, EarlyView.
Block Diagram of the Robust Adaptive One‐Sample‐Ahead Preview Super‐Twisting Sliding Mode Controller. ABSTRACT This article introduces a discrete‐time robust adaptive one‐sample‐ahead preview super‐twisting sliding mode controller. A stability analysis of the controller by Lyapunov criteria is developed to demonstrate its robustness in handling both ...
Guilherme Vieira Hollweg, Paulo Jefferson Dias de Oliveira Evald, Shivam Chaturvedi, Hilton Abilio Gründling, Rodrigo Varella Tambara, Wencong Su   +5 more
wiley   +1 more source

Research on Distribution Characteristics of DC Potential Near the UHVDC Grounding Electrode

IEEE Access, 2020
The rated current of ±800kV Ultra High Voltage Direct Current (UHVDC) Transmission system can be up to 6250A, so that the influence of the DC grounding current of electrode is enormous.
Jianhong Hao, Wanyi Teng, Yuguan Zhang, Wenlin Liu   +3 more
doaj   +1 more source

Hybrid single-electron transistor as a source of quantized electric current

, 2007
The basis of synchronous manipulation of individual electrons in solid-state devices was laid by the rise of single-electronics about two decades ago. Ultra-small structures in a low temperature environment form an ideal domain of addressing electrons ...
Averin, Dmitri V., Meschke, Matthias, Mottonen, Mikko, Pekola, Jukka P., Saira, Olli-Pentti, Vartiainen, Juha J.   +5 more
core   +1 more source

Thermoreflectance Detection of Point Defects Resulting from Focused Ion Beam Milling

Advanced Engineering Materials, EarlyView.
Focused ion beam (FIB) milling is a common tool for nanoscale material processing, however irradiation damage, redeposition, and contamination can occur. We use several characterization tools to show FIB‐induced effects beyond 1 mm from the milled area.
Thomas W. Pfeifer, Eric R. Hoglund, Anton V. Ievlev, Patrick E. Hopkins   +3 more
wiley   +1 more source

On performance evaluation of high‐power, high‐bandwidth current measurement technologies for SiC switching devices

IET Power Electronics
Silicon carbide (SiC) power metal‐oxide‐semiconductor field‐effect transistors (MOSFETs) switch at an unprecedented speed, even at high currents. For accurate dynamic characterization, current sensors must measure high currents at a high bandwidth ...
Daniel A. Philipps, Dimosthenis Peftitsis   +1 more
doaj   +1 more source