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Development and Evaluation of a Quadrant Silicon Pad Sensor for the TexAT Active Target Detector. [PDF]

open access: yesSensors (Basel)
Gu GM   +7 more
europepmc   +1 more source
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Reliability testing by precise electrical measurement

International Test Conference 1988 Proceeding@m_New Frontiers in Testing, 2003
Tests have been devised which provide indication of incipient failure of CMOS devices. The experimental methodology to confirm the value of the tests depends on the acceptance of the Arrenhius relationships as it was investigated using accelerated life test techniques.
A. P. Dorey   +4 more
openaire   +1 more source

Resistance-frequency eddy current method for electrical conductivity measurement

Measurement: Journal of the International Measurement Confederation, 2023
Dehui Wu
exaly  

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