Non-Invasive Phenotyping of Sugar Beet and Maize Roots Using Field-Scale Spectral Electrical Impedance Tomography. [PDF]
Michels V +4 more
europepmc +1 more source
A bespoke multilayer thin film configuration has been designed, which overcomes the material dependency of conventional isotope exchange Raman spectroscopy (IERS). This universal IERS methodology is efficient, non‐destructive and provides additional structural information and time resolution, which can be further extended to various isotopic elements ...
Zonghao Shen +7 more
wiley +1 more source
Decoupling Junction and Nanosheet Transport in Graphene Networks via Simple DC Temperature-Dependent Measurements. [PDF]
Coleman E +8 more
europepmc +1 more source
Integration of spatially variable riverbed hydraulic conductivity from Electrical Resistivity Tomography (ERT) and Induced Polarization (IP) into a groundwater flow model using multiple-point geostatistics [PDF]
Benoit, Sien +5 more
core +1 more source
Device Integration Technology for Practical Flexible Electronics Systems
Flexible device integration technologies are essential for realizing practical flexible electronic systems. In this review paper, wiring and bonding techniques critical for the industrial‐scale manufacturing of wearable devices are emphasized based on flexible electronics.
Masahito Takakuwa +5 more
wiley +1 more source
Gauss-Newton inversion of ground transient electromagnetic data using COMSOL multiphysics. [PDF]
Li F, Wang P, Lu K.
europepmc +1 more source
Deep and Shallow Electrical Resistivity Tomographies on the Budoia-Aviano Thrust (NE Italy)
Enzo Rizzo +10 more
openalex +1 more source
This study investigates electromechanical PUFs that improve on traditional electric PUFs. The electron transport materials are coated randomly through selective ligand exchange. It produces multiple keys and a key with motion dependent on percolation and strain, and approaches almost ideal inter‐ and intra‐hamming distances.
Seungshin Lim +7 more
wiley +1 more source
Geostatistical joint inversion of frequency-domain electromagnetic data and direct current resistivity data for near-surface modelling. [PDF]
Narciso J, Verhegge J, Van De Vijver E.
europepmc +1 more source

