Results 111 to 120 of about 330,347 (201)

Switching speed limits in electrically driven VO₂ structural Mott-Peierls transition. [PDF]

Nat Commun
Pofelski A, Liu C, Reisbick SA, Han MG, Wu L, Navarro H, Qiu E, Wang TD, Mousavi M SS, Alspaugh DJ, Rozenberg M, Ramanathan S, Schuller IK, Zhu Y.   +13 more
europepmc   +1 more source

Developments in Nanopatterning of Graphene; Toward Direct Writing. [PDF]

Adv Mater
Abrahamczyk S, Sakreida O, Bachmatiuk A, Martynková GS, Rümmeli MH.   +4 more
europepmc   +1 more source

Radiation-dose effects in correlative X-ray/cryo-electron microscopy of frozen-hydrated biological samples. [PDF]

Acta Crystallogr D Struct Biol
Blum TB, Olieric V, Diaz A, Ishikawa T, Korkhov VM.   +4 more
europepmc   +1 more source

Tailoring electron bunch quality in laser-plasma acceleration: a comparative study of Bessel-Gaussian and Gaussian laser profiles under variable plasma density geometries. [PDF]

Sci Rep
Khooniki R, Fallah R, Khorashadizadeh SM, Niknam AR.   +3 more
europepmc   +1 more source

Decision-making in serial crystallography: a simple test to quickly determine whether sufficient data have been collected. [PDF]

Acta Crystallogr D Struct Biol
von Stetten D, Pearson AR.
europepmc   +1 more source

Scanning-Based Dynamic Mask Projection for Ultrafast Laser Ablation of Thin Films. [PDF]

Nanomaterials (Basel)
Amann J, Kircher M, Otto A, Hajas BI, Kirnbauer A, Baltrukonis J, Fürbacher R.   +6 more
europepmc   +1 more source

Quantifying the Full Damage Profile of Focused Ion Beams via 4D-STEM Precession Electron Diffraction and PSNR Metrics. [PDF]

Small Methods
Masteghin MG, Aslam ZP, Brown AP, Whiting MJ, Clowes SK, Webb RP, Cox DC.   +6 more
europepmc   +1 more source

Recent Advances of Electron Beam Processing (I)

SHINKU, 1966
openaire   +3 more sources

Efficient detection of deformation-induced microstructural modifications in polycrystalline micropillars using scanning X-ray nanodiffraction. [PDF]

J Appl Crystallogr
Davydok A, Singh K, Rout SS, Krywka C.
europepmc   +1 more source

High-fidelity chip delayering using green (515 nm) femtosecond lasers. [PDF]

Sci Rep
Anaei MTM, Maniscalco M, Choi H, Emanuel M, Roser W, Bliznakov T, Moore T, Phoulady A, Mahyari P, Blagojevic A, May N, Egan GC, Shahbazmohamadi S, Tavousi P.   +13 more
europepmc   +1 more source