Results 51 to 60 of about 330,347 (201)

Deciphering the microstructural and excellent property in electron beam wire-fed additive manufactured of β Ti–10V–2Fe–3Al alloy

Journal of Materials Research and Technology
The Ti–10V–2Fe–3Al titanium alloy is extensively utilized in aerospace, biomedicine, and various other sectors owing to its exceptional processing characteristics and high-temperature resistance, nevertheless, conventional manufacturing methods often ...
Yupu Cheng, Chen Liu, Guoqiang Zhu, Baoxian Su, Chunzhi Zhao, Shu Guo, Chao Xu, Liang Wang, Yanqing Su   +8 more
doaj   +1 more source

Transient pulse analysis of ionized electronics exposed to γ-radiation generated from a relativistic electron beam

AIP Advances, 2018
When a semiconductor element is irradiated with radiation in the form of a transient pulse emitted from a nuclear explosion, a large amount of charge is generated in a short time in the device.
Sun-Hong Min, Ohjoon Kwon, Matlabjon Sattorov, In-Keun Baek, Seontae Kim, Dongpyo Hong, Jin-Young Jeong, Jungmin Jang, Anirban Bera, Ranjan Kumar Barik, Ranajoy Bhattacharya, Ilsung Cho, Byungsu Kim, Chawon Park, Wongyun Jung, Seunghyuk Park, Gun-Sik Park   +16 more
doaj   +1 more source

Focused ion beam milling strategy for sub-micrometre holes in silicon [PDF]

, 2008
Focused ion beam (FIB) milling can be used as a tool to fabricate structures with sub-micrometer details. The slab material can be silicon, for example, which can then be used as a mould for nano-imprint lithography, or in silicon on insulator (SOI ...
Ay, Feridun, Hopman, Wico C.L., Ridder, René M. de   +2 more
core   +2 more sources

Beam size and position measurement based on logarithm processing algorithm in HLS II

, 2015
A logarithm processing algorithm to measure beam transverse size and position is proposed and preliminary experimental results in Hefei Light Source II (HLS II) are given.
Cheng, Chaocai, Duan, Qingming, Li, Hao, Lu, Ping, Luo, Qing, Sun, Baogen, Tang, Kai, Wang, Jigang, Wu, Fangfang, Yang, Yongliang, Zheng, Jiajun, Zhou, Zeran   +11 more
core   +1 more source

Absolute beam position monitoring using HOM-damper signals [PDF]

, 2005
To preserve the required beam quality in an e+/e- collider it is necessary to have a very precise beam position control at each accelerating cavity. An elegant method to avoid additional length and beam disturbance is the usage of signals from existing ...
Hülsmann, Peter, Klein, Horst, Peschke, Claudius, Schreiber, Gerald   +3 more
core  

Enhancement mode double top gated MOS nanostructures with tunable lateral geometry

, 2009
We present measurements of silicon (Si) metal-oxide-semiconductor (MOS) nanostructures that are fabricated using a process that facilitates essentially arbitrary gate geometries.
E. H. Nicollian, E. P. Nordberg, G. A. Ten Eyck, H. L. Stalford, J. Buckley, J. D. Jackson, J. R. Wendt, J. Stevens, K. D. Childs, K. Eng, L. A. Tracy, L. P. Kouwenhoven, L. P. Kouwenhoven, M. A. Eriksson, M. P. Lilly, M. S. Carroll, R. K. Grubbs, R. P. Muller, R. W. Young, T. M. Gurrieri, T. P. Ma   +20 more
core   +1 more source

Maskless milling of diamond by a focused oxygen ion beam [PDF]

, 2015
Recent advances in focused ion beam technology have enabled high-resolution, maskless nanofabrication using light ions. Studies with light ions to date have, however, focused on milling of materials where sub-surface ion beam damage does not inhibit ...
Aharonovich, I, Botman, A, Martin, AA, Randolph, S, Toth, M   +4 more
core   +1 more source

Microstructure and mechanical properties of a high Nb-TiAl alloy fabricated by electron beam melting

Materials & Design, 2018
Electron beam melting (EBM) has been applied to fabricate a high Nb-TiAl alloy with a fully dense microstructure and good tensile properties at both room and high temperatures.
W. Kan, B. Chen, C. Jin, H. Peng, J. Lin
doaj   +1 more source

Phase field simulation of dendritic microstructure in additively manufactured titanium alloy [PDF]

, 2019
Additive manufacturing (AM) processes for metals, such as selective laser sintering and electron beam melting, involve rapid solidification process. The microstructure of the fabricated material and its properties strongly depend on the solidification ...
Meng, Lingbin, Wu, Linmin, Zhang, Jing, Zhang, Yi   +3 more
core   +1 more source

Development and fabrication of a solar cell junction processing system [PDF]

Development of a pulsed electron beam subsystem, wafer transport system, and ion implanter are discussed. A junction processing system integration and cost analysis are reviewed.
Banker, S.
core   +1 more source