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Low-Energy Electron Microscopy
Reports on Progress in Physics, 1990Low energy electron microscopy (LEEM) is a surface imaging technique in which the surface is illuminated by an approximately parallel electron beam at near normal incidence. The image is formed with those electrons which are elas- tically backscattered into a small angular region around the surface normal.
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ANALYTICAL TRANSMISSION ELECTRON MICROSCOPY
Annual Review of Materials Research, 2005▪ Abstract  Chemical analysis at high spatial resolution is the domain of analytical transmission electron microscopy. Owing to rapid instrumental developments during the past decade, electron energy-loss spectroscopy offers now a spatial resolution close to 0.1 nm and an energy resolution close to 0.1 eV.
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Journal of the American Pharmaceutical Association (Practical Pharmacy ed.), 1945
V K, ZWORYKIN, J, HILLIER
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V K, ZWORYKIN, J, HILLIER
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