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Electron Probe Microanalysis

Physics Bulletin, 1970
A J Tousimis and L Marton London: Academic Press 1970 pp xii + 450 price £10 10s This book consists of a collection of papers and reviews on different aspects of electron probe microanalysis, based on the papers presented at the first national conference on electron probe microanalysis, held at the University of Maryland in 1966.
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Electron probe microanalysis

1995
Electron probe microanalysis makes use of the X-ray spectrum emitted by a solid sample bombarded with a focused beam of electrons to obtain a localized chemical analysis. All elements from atomic number 4 (Be) to 92 (U) can be detected in principle, though not all instruments are equipped for ‘light’ elements (Z < 10). Qualitative analysis involves the
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Electron Probe Microanalysis

1960
Publisher Summary This chapter describes various aspects of electron probe microanalysis. The principal elements of a conventional electron probe microanalyzer are four in number. An electron optics system, consisting of an electron gun followed by reducing lenses, whose role is to produce at the level of the sample an electron probe with a diameter ...
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Probe current stability in electron-probe microanalysis

Journal of Physics E: Scientific Instruments, 1968
Quantitative electron-probe microanalysis requires a stable probe current. With adequately stable supply voltages, the main cause of instability in the conventional triode electron gun is movement of the tip of the tungsten hairpin filament forming the cathode.
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Electron probe microanalysis of metal oxides

Journal of Physics E: Scientific Instruments, 1968
An experimental procedure for the analysis of nonconducting specimens by using metal standards is described. The specimens are coated with about 100 A of copper by vacuum evaporation to prevent electrostatic charging and to reduce heating effects. It is found that specimens should be preferably dry polished and analysed under fixed time conditions ...
C A, Friskeny, C W, Haworth
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Scanning electron probe microanalysis

Micron, 1993
Abstract The development of the scanning electron microprobe analyser forms an interesting case study on the transformation of a scientific idea into an established physical technique. Ellis Cosslett initiated the work in 1953 in the belief that it would find widespread application in other disciplines and later in the decade this hope was realised ...
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Electron probe microanalysis

1987
Microprobe analysis techniques differ from most other techniques used to analyse geological materials in that they involve the excitation and chemical analysis of selected areas of diameter as small as a few microns on the surface of samples. Specimens must therefore be prepared as polished geological thin sections mounted on a glass slide backing, or ...
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Scanning Electron Probe Microanalysis

Journal of the Forensic Science Society, 1966
This paper outlines the principle of microprobe analysis and the development of the technique, together with a description of some of the current instrumentation. The technique has been applied to many fields ; some of these applications are reviewed and recent advances including soft X-ray analysis and kossel lines are discussed.
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Electron Probe Microanalysis

1974
Electron probe microanalysis is an analytical technique that may be used to determine the chemical composition of a solid specimen weighing as little as 10−11 g and having a volume as small as 1 µm3. The primary advantage of electron probe microanalysis over other analytical methods is the possibility of obtaining a quantitative analysis of a specimen ...
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Electron Probe X-Ray Microanalysis

1986
Abstract Electron probe microanalysis (EPMA) makes it possible to combine structural and compositional analysis in one operation. This article describes the basic concepts of microanalysis and the processing of EPMA that involves the measurement of the characteristic X-rays emitted from a microscopic part of a solid specimen bombarded by
Kurt F.J. Heinrich, Dale E. Newbury
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