Results 131 to 140 of about 531 (180)

Electronic speckle pattern interferometry using optical fibers

Optics Communications, 1981
Abstract Initial experiments using electronic speckle pattern interferometry with fiberoptic imaging and illumination are described.
Ole J. Løkberg, Kåre Krakhella
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"Continuous" Pulsed Electronic Speckle Pattern Interferometry

SPIE Proceedings, 1987
Holography and allied techliques such as electronic speckle pattern interferometry (ESPI) have the potential to provide the engineer with a powerful measuring technique. Why, therefore, is it not a technique readily available and widely used? Several arguments can be put forward; complexity, skill level, ease of use, in-situ capability, and ability to ...
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Fringe Visibility In Electronic Speckle Pattern Interferometry

SPIE Proceedings, 1987
In electronic speckle pattern interferometry, the visibility of resultant fringes are influenced by inhomogeneity of the object light and the reference light. Moreover, the resultant fringes have granularity, which is the drawback of ESPI. Two methods to improve the visibility of resultant fringes are proposed.
Motoki Yonemura, Shigeru Hagihara
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Stroboscopic illumination for electronic speckle pattern interferometry

The Journal of the Acoustical Society of America, 2015
A common realization of holographic interferometry is called Electronic Speckle Pattern Interferometry (or ESPI)—a technique capable of measuring harmonic modes of vibrating objects. We present a method of improving the contrast and quality of fringe patterns recorded with a simple, table-top ESPI system.
Colin Gavin, Steve Tufte
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In-plane electronic speckle pattern shearing interferometry

Optics and Lasers in Engineering, 1997
An analysis of the out-of-plane shearing interferometer has been performed which shows that production of in-plane strain partial derivatives is possible, which are not affected by out-of-plane displacement function components. The in-plane data are represented as subtraction correlation fringes.
J.R. Tyrer, J.N. Petzing
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Synchronous Stroboscopic Electronic Speckle Pattern Interferometry

SPIE Proceedings, 1986
Electronic Speckle Pattern Interferometry (E.S.P.I) oftenly called Electronic Holography is a practical powerful technique in non-destructive testing. Practical capabilities of the technique have been improved by fringe betterment and the control of analysis in the time domain, in particular, the scanning of the vibration cycle, with introduction of ...
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Improvements on Electronic Speckle Pattern Interferometry

1987
Fibre optics and synchronized amplitude and phase illuminating pulse modulation, controlled by microprocessor, are combined to improve performance and capabilities of measurements with E.S.P.I.. Cosmetic and resolution betterment of specklegrams is achieved while at the same time it is possible to design a portable and compact set-up, insensitive to ...
O. D. D. Soares, A. L. V. S. Lage, H. Sakowski   +2 more
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Singlemode optical fiber electronic speckle pattern interferometry

Optics and Lasers in Engineering, 1996
This paper describes two electronic speckle pattern interferometric (ESPI) systems using single mode optical fibers, namely, conventional ESPI and phase shifting ESPI (PSESPI), and their applications to the inspection of unbonds in carbon-epoxy honeycomb composite structures.
Liu, W., Tan, Y., Shang, H.M.
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Surface contouring using electronic speckle pattern interferometry

Second International Conference on Photomechanics and Speckle Metrology: Speckle Techniques, Birefringence Methods, and Applications to Solid Mechanics; Moiré Techniques, Holographic Interferometry, Optical NDT, and Applications to Fluid Mechanics, 1991
Electronic Speckle Pattern Interferometry is used extensively throughout the Engineering sector as an analytical tool. The full potential of the instrument may be realized by the ability to record and shape data without alterations to the optical present here a method of shape measurement which may be optical apparatus identical to conventional out-of ...
David Kerr, Ramon Rodriguez-Vera, Fernando Mendoza Santoyo   +2 more
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Contouring by Electronic speckle Pattern Interferometry (ESPI)

SPIE Proceedings, 1986
A method of optically contouring object surfaces for inspection purposes, based on electronic speckle pattern interferometry is described. The technique forms a "bolt-on" addition to existing ESPI systems. It is shown that the correlation fringe contours thus obtained are equivalent to those of projected, two-beam interference fringe contours ...
B. D. Bergquist, P. Montgomery
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