Results 1 to 10 of about 6,070 (177)

Dual-Modal Sensing Skin Adaptive to Daylight, Darkness, and Ultraviolet Light for Simultaneous Full-Field Deformation Measurement and Mechanoluminescence Responses. [PDF]

open access: yesAdv Sci (Weinh)
A dual‐modal sensing skin for deformation visualization is developed by integrating mechanoluminescence and digital image correlation techniques. It functions effectively under various lighting conditions, such as daylight, complete darkness, and UV irradiation.
Timilsina S   +4 more
europepmc   +2 more sources

Extended-range temporal electronic speckle pattern interferometry [PDF]

open access: yesApplied Optics, 2002
In recent years the availability of high-speed digital video cameras has motivated the study of electronic speckle pattern interferometry (ESPI) in the time domain. To this end a properly sampled temporal sequence of N-fringe patterns is used to analyze the temporal experiment.
Quiroga Mellado, Juan Antonio   +2 more
openaire   +4 more sources

Oblique incidence and observation electronic speckle-pattern interferometry [PDF]

open access: yesApplied Optics, 1994
In this paper we discuss an oblique incidence and observation electronic speckle-pattern interferometer, in which we use an anamorphic prism in front of the object. A collimated beam traveling through the prism is partly reflected at the base of the prism.
Joenathan, Charles   +2 more
openaire   +4 more sources

Electronic Speckle Pattern Shearing Interferometry using Photopolymer Diffractive Optical Elements for Vibration Measurements [PDF]

open access: yes, 2004
Electronic speckle pattern shearing interferometry (ESPSI) is superior to Electronic speckle pattern interferometry (ESPI) when strain distribution, arising from object deformation or vibration, need to be measured.
Martin, Suzanne   +3 more
core   +2 more sources

Electronic shearography: current capabilities, potential limitations, and future possibilities for industrial nondestructive inspection [PDF]

open access: yes, 1993
Image-shearing speckle pattern interferometry, more commonly referred to as ‘shearography’, is a full-field, laser-based interferometric technique first developed for applications in experimental mechanics [1,2].
Deaton, John, Jr., Rogowski, Robert S.
core   +4 more sources

Direct strain and slope measurement using 2D DSPSI Title [PDF]

open access: yes, 2011
Large variety of optical full-field measurement techniques are being developed and applied to solve mechanical problems. Since each technique possess its own merits, it is important to know the capabilities and limitations of such techniques. Among these
Dandach, Wajdi   +2 more
core   +3 more sources

Phase-shifting algorithms for electronic speckle pattern interferometry [PDF]

open access: yesApplied Optics, 2002
A set of innovative phase-shifting algorithms developed to facilitate metrology based on electronic speckle pattern interferometry (ESPI) are presented. The theory of a phase-shifting algorithm, called a (5,1) algorithm, that takes five phase-shifted intensity maps before a specimen is deformed and one intensity map after a specimen is deformed is ...
Kuang-Chong Wu   +5 more
openaire   +2 more sources

High-speed electronic speckle pattern interferometry [PDF]

open access: yes, 2004
Electronic Speckle Pattern Interferometry (ESPI) is used to measure surface displacements. Phase shifting can be used to obtain a fringe pattern which depicts the phase at every point in an image. Previous studies have used algorithms such as the 4-bucket algorithm to obtain phase maps of objects.
openaire   +3 more sources

Michelson Interferometry with the Keck I Telescope [PDF]

open access: yes, 2000
We report the first use of Michelson interferometry on the Keck I telescope for diffraction-limited imaging in the near infrared JHK and L bands. By using an aperture mask located close to the f/25 secondary, the 10 m Keck primary mirror was transformed ...
Buscher D.   +22 more
core   +2 more sources

Adaptive Aperture Defocused Digital Speckle Photography

open access: yes, 2005
Speckle photography can be used to monitor deformations of solid surfaces. The measuring characteristics, such as range or lateral resolution depend heavily on the optical recording and illumination set-up.
Diazdelacruz, Jose M.
core   +1 more source

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