Results 1 to 10 of about 476,683 (323)

Extended-range temporal electronic speckle pattern interferometry [PDF]

Applied Optics, 2002
In recent years the availability of high-speed digital video cameras has motivated the study of electronic speckle pattern interferometry (ESPI) in the time domain. To this end a properly sampled temporal sequence of N-fringe patterns is used to analyze the temporal experiment.
Quiroga Mellado, Juan Antonio, Servín Guirado, Manuel, Dávila Álvarez, Abundio   +2 more
openaire   +6 more sources

Oblique incidence and observation electronic speckle-pattern interferometry [PDF]

Applied Optics, 1994
In this paper we discuss an oblique incidence and observation electronic speckle-pattern interferometer, in which we use an anamorphic prism in front of the object. A collimated beam traveling through the prism is partly reflected at the base of the prism.
Joenathan, Charles, Franze, Bernhard, Tiziani, Hans J.   +2 more
openaire   +5 more sources

Deep Learning in the Phase Extraction of Electronic Speckle Pattern Interferometry [PDF]

Electronics
Electronic speckle pattern interferometry (ESPI) is widely used in fields such as materials science, biomedical research, surface morphology analysis, and optical component inspection because of its high measurement accuracy, broad frequency range, and ...
Wenbo Jiang, Tong Ren, Qianhua Fu
semanticscholar   +2 more sources

Electronic speckle pattern shearing interferometry using photopolymer diffractive optical elements for vibration measurements [PDF]

, 2004
Electronic speckle pattern shearing interferometry (ESPSI) is superior to Electronic speckle pattern interferometry (ESPI) when strain distribution, arising from object deformation or vibration, need to be measured.
Emilia Mihaylova, Izabela Naydenova, Suzanne Martin, Vincent Toal   +3 more
openalex   +3 more sources

Direct strain and slope measurement using 2D DSPSI Title [PDF]

Advanced Materials Research 324 (2011) 384-387, 2011
Large variety of optical full-field measurement techniques are being developed and applied to solve mechanical problems. Since each technique possess its own merits, it is important to know the capabilities and limitations of such techniques. Among these optical full-field methods, interferometry techniques take an important place.
Dandach, Wajdi, Molimard, Jérôme, Picart, Pascal   +2 more
arxiv   +5 more sources

Modern optical astronomy: technology and impact of interferometry [PDF]

Rev.Mod.Phys.74:551-600,2002, 2002
The present `state of the art' and the path to future progress in high spatial resolution imaging interferometry is reviewed. The review begins with a treatment of the fundamentals of stellar optical interferometry, the origin, properties, optical effects of turbulence in the Earth's atmosphere, the passive methods that are applied on a single ...
Ables, J. G., Aime, C., Akeson, R., Anderson, J. A., Angel, J. R. P., Angel, J. R. P., Angel, J. R. P., Angel, J. R.,, Antoshkin, L. V., Aretxaga, I., Armstrong, J.,, Arnold, L., Ayers, G. R., Baba, N., Baba, N., Baba, N., Babcock, H. W., Babcock, H. W., Bagnuolo, W. G., Jr., Baldwin, J., Baldwin, J., Baldwin, J., Baldwin, J. E., Baldwin, J. E., Balick, B., Barlow, M. J., Barnaby, D., Beckers, J. M., Bedding, T., Bedding, T. R., Beichman, C., Benson, J., Berger, J., Berio, P., Berio, P., Bester, M., Blazit, A., Blöcker, T., Boccaletti, A., Boccaletti, A., Boden, A.,, Bonneau, D.,, Bonneau, D.,, Bouvier, J., Bracewell, R. N., Brandl, B., Brandner, W., Bruns, D., Burge, J. H., Burns, D., Burns, D., Butler, R.,, Cadot, O., Callados, M.,, Carleton, N., Cassinelli, J., Charbonneau, D., Clampin, M., Clampin, M., Close, L., Colavita, M., Colavita, M., Colavita, M.,, Conan, J.-M., Conan, R., Cooper, D., Cornwell, T. J.,, Coudé du Foresto, V., Coulman, C. E., Coulman, C. E., Currie, D., Danchi, W. C., Danchi, W. C., Dantowitz, R., Davidge, T. J., Davidge, T. J., Davis, J., Davis, J., Davis, J., Davis, J., Dayton, D., Dejonghe, J., Denker, C., Derie, F., DiBenedetto, G. P., Drummond, J., Dullemond, C. P., Dyck, H., Dyck, H., Ebstein, S., Eke, V., Elias, N. M., Falcke, H., Faucherre, M., Fienup, J. R., Fischer, O., Fizeau, H., Foy, R., Foy, R., Fried, D. L., Fugate, R., Gauger, A., Gerchberg, R. W., Gies, R., Glindemann, A., Golimowski, D. A., Gonsalves, S. A., Gorham, P. W., Greenwood, D. P., Haguenauer, P., Hajian, A., Hale, D., Hale, D., Hanbury Brown, R., Hanbury Brown, R., Haniff, C., Harmanec, P., Hartley, M., Harvey, J. W., Harvey, J. W., Hawley, S. A., Hege, E., Hestroffer, D., Heydari, M., Hill, J. M., Hinz, P., Hofmann, K.-H., Hummel, C., Hutchings, J., Hutchings, J., Hutchings, J., Högbom, J., Jefferies, S., Jennison, R. C., Karovska, M., Kenworthy, M., Kervella, P., Knox, K., Koechlin, L., Korff, D., Kunz, M., Labeyrie, A., Labeyrie, A., Labeyrie, A., Labeyrie, A., Labeyrie, A., Labeyrie, A., Labeyrie, A., Labeyrie, A., Labeyrie, A., Lai, O., Lai, O., Lane, B., Lannes, A., Lawson, P., Lawson, P., Lawson, P. R., Lawson, P. R., Ledoux, C., Lee, J., Lefèvre, H. C., Liang, J., Lindengren, L., Lipman, E., Liu, Y. C., Lloyd-Hart, M., Lloyd-Hart, M., Lohmann, A., Lopez, B., Lovelock, J. E., Lucy, L., Lynds, C., Léger, A., Machida, Y., Mackay, C. D., Magain, P., Malbet, F., Marco, O., Masciadri, E., Mason, B., Mason, B. D., Mayor, M., McAlister, H., Mennesson, B., Men’shchikov, A., Michelson, A. A., Michelson, A. A., Millan-Gabet, R., Monnier, J., Monnier, J., Monnier, J., Morel, S., Morel, S., Mouillet, D., Mourard, D., Mourard, D., Mozurkewich, D., Márquez, I., Nakajima, T., Nakajima, T., Natta, A., Nelkin, M., Nisenson, P., Nisenson, P., Nordgren, T., Northcott, M. J., Nota, A., Nulsen, P., Padilla, C., Papaliolios, C., Papaliolios, C., Pauls, T., Paxman, R., Pedretti, E., Pedretti, E., Pehlemann, E., Penny, A., Perrin, G., Perrin, G., Perrin, G., Perryman, M. A. C., Poulet, F., Pourbaix, D., Prieur, J., Quirrenbach, A., Quirrenbach, A., Quirrenbach, A., Rabbia, Y., Ragazzoni, R., Reinheimer, T., Richardson, W. H., Ridgway, S. T., Rimmele, T. R., Robbe, S., Robertson, N. A., Roddier, C., Roddier, F., Roddier, F., Roddier, F., Roddier, F., Roggemann, M. C., Rouan, D., Rouan, D., Rouan, D., Rousselet-Perraut, K., Rousset, G., Ryan, S., Saha, S. K., Saha, S. K., Saha, S. K., Saha, S. K., Saha, S. K., Saha, S. K., Sams, B. J., Sato, K., Schertl, D., Schöller, M., Seldin, J., Seldin, J., Serabyn, E., Shannon, C. J., Shao, M., Shao, M., Shao, M., Sicardy, B., Simon, M., Stee, P., Stee, P., Swapan K. Saha, Tango, W. J., Tatarski, V. I., Thom, C., Thompson, L. A., Timothy, J. G., Torres, G., Townes, C. H., Traub, W. A., Traub, W. A., Traub, W. A., Troxel, S. E., Tuthill, P., Tuthill, P., Tuthill, P. G., Tuthill, P. G., Tuthill, P. G., Ulrich, M., Unwin, S., Vakili, F., Vakili, F., van Belle, G., van Belle, G., van Belle, G., Von der Lühe, O., Walkup, J. F., Wallace, J., Weigelt, G., Weigelt, G., Weigelt, G., Weigelt, G., Weigelt, G., Weinberger, A., Wilken, V., Wilson, R., Wittkowski, M., Wittkowski, M., Wittkowski, M., Wittkowski, M., Wood, P., Wood, P., Worden, S. P., Wyngaard, J. C., Young, A. T., Young, J.   +312 more
arxiv   +4 more sources

Study of Rubber Blends by Electronic Speckle Pattern Interferometry

Procedia Engineering, 2016
AbstractNowadays, the optical methods for deformation measurement are gaining more and more applications from the aspect of solution of problems relating to elasticity and strength. The advantage of such methods is based on the measurement of non-destructive way without assembly of measuring elements regarding to the critical areas of structures.
Dana Bakošová, Ivan Kopal
openaire   +3 more sources

Fully automated extraction of the fringe skeletons in dynamic electronic speckle pattern interferometry using a U-Net convolutional neural network [PDF]

Optical Engineering: The Journal of SPIE, 2019
. With the development of artificial intelligence technology, intelligent fringe processing is a goal of relevant researchers in optical interferometry.
Biyuan Li, Chen Tang, Tingyue Zheng, Z. Lei   +3 more
semanticscholar   +2 more sources

Electronic Speckle Pattern Interferometry for Vibrational Analysis of Cutting Tools [PDF]

Acta Mechanica et Automatica, 2018
A Michelson interferometer based ESPI system for static and vibration out of plane displacement measurements is presented. The aim of the article is to demonstrate the usability of ESPI non-contact measurement method in the field of machining.
P. Mrozek, E. Mrozek, A. Werner
semanticscholar   +2 more sources

Contouring by electronic speckle pattern interferometry with quadruple-beam illumination [PDF]

Applied Optics, 1992
We present a new arrangement for contouring by electronic speckle pattern interferometry with four illumination beams, thereby making it unnecessary to move anything during the measurement.
Zou, Yunlu, Diao, Hongyan, Peng, Xiang, Tiziani, Hans J.   +3 more
openaire   +7 more sources