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Electronic speckle pattern interferometry for modal analysis

The Journal of the Acoustical Society of America, 2005
Electronic speckle pattern interferometry is a common method for determining resonant frequencies and visualizing mode shapes of relatively small objects; however, the apparatus required for this type of interferometry is typically expensive and extremely sensitive to ambient vibrations.
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Multiwavelength electronic speckle pattern interferometry for surface shape measurement

Applied Optics, 2007
Profilometry by electronic speckle pattern interferometry with multimode diode lasers is both theoretically and experimentally studied. The multiwavelength character of the laser emission provides speckled images covered with interference fringes corresponding to the surface relief in single-exposure processes. For fringe pattern evaluation, variations
Barbosa, Eduardo A., Lino, Antonio C. L.
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Phase extraction from electronic speckle pattern interferometry addition fringes

Applied Optics, 1994
Addition fringes are obtained in real time from electronic speckle pattern interferometry (ESPI) by use of a twin-pulsed laser when two pulses are fired during a single field of a CCD camera. This enables object deformations to be studied in harsh environmental conditions.
A J, Moore, J R, Tyrer, F M, Santoyo
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Electronic Speckle‐Pattern Interferometry Measurements of Structural Ratcheting Strain

Strain, 2010
Abstract:  Several tensile specimens with a central hole were subjected to a cyclic loading for which the Von Mises stress was beyond the initial yield stress in the vicinity of the hole. The tensile machine was fixed together with a phase‐shifting electronic speckle‐pattern interferometry measurement bench that makes it possible to perform strain ...
Farge, L., Nazarov, R., Ayadi, Z.
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Electronic Speckle Pattern Interferometry for Micromechanical Measurements

Advanced Engineering Materials, 2002
A new optical setup that could be used for the analysis of displacement (or strain) of objects with diffuse as well as mirror-like reflecting (specular) surfaces is presented here together with the algorithm of data analysis. Combination of these two new approaches allows to minimize the area of analysis and to extend the class of materials to which ...
S. Tamulevičius   +3 more
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Additive/subtractive decorrelated electronic speckle pattern interferometry

Optical Engineering, 1993
A hybrid additive-subtractive decorrelated electronic speckle pattern interferometry (ESPI) scheme using a continuous reference updating technique is presented. Unlike conventional ESPI techniques, this method uses speckle phase decorrelation between successively subtracted additive correlated speckle images, each of which contains information about ...
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ELECTRONIC SPECKLE PATTERN INTERFEROMETRY

1978
John N. Butters   +2 more
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