Results 241 to 250 of about 476,683 (323)

New applications of electronic speckle pattern interferometry in novel materials and structures

Optical Metrology, 2019
Electronic Speckle Pattern Interferometry (ESPI) is a full-field technique based on interferometry that has found applications in a wide range of domains mostly related in the field of non-destructive testing.
V. Pagliarulo, P. Ferraro
semanticscholar   +1 more source

General filtering method for electronic speckle pattern interferometry fringe images with various densities based on variational image decomposition.

Applied Optics, 2017
Filtering off speckle noise from a fringe image is one of the key tasks in electronic speckle pattern interferometry (ESPI). In general, ESPI fringe images can be divided into three categories: low-density fringe images, high-density fringe images, and ...
Biyuan Li, Chen Tang, Guannan Gao, Mingming Chen, Shuwei Tang, Z. Lei   +5 more
semanticscholar   +1 more source

Intensity distortions due to phase-only spatial light modulation: Characterization for applications in electronic speckle-pattern interferometry.

Review of Scientific Instruments, 2018
Electronic speckle-pattern interferometry (ESPI) is a powerful tool for precise, full-field, and non-contact contouring of optically rough surfaces.
Laura Bilgeri, F. Bloise, F. Bloise, Min Lu, Shengjia Wang, M. Jakobi, Alexander W. Koch   +6 more
semanticscholar   +1 more source

Combination of oriented partial differential equation and shearlet transform for denoising in electronic speckle pattern interferometry fringe patterns.

Applied Optics, 2017
It is a key step to remove the massive speckle noise in electronic speckle pattern interferometry (ESPI) fringe patterns. In the spatial-domain filtering methods, oriented partial differential equations have been demonstrated to be a powerful tool.
Wenjun Xu, Chen Tang, Fan Gu, Jiajian Cheng   +3 more
semanticscholar   +1 more source

Electronic Speckle Pattern Interferometry

Topical Meeting on Holography, 1986
Holographic workstations are now enabling the advantages of Holographic Interferometry (HI) to be taken outside research laboratories and placed alongside manufacturing equipment. Most rigidization problems have been overcome but two handicaps still limit its widespread application.
openaire   +2 more sources

Simultaneous 2D in-plane deformation measurement using electronic speckle pattern interferometry with double phase modulations

, 2018
Electronic speckle pattern interferometry (ESPI) and digital speckle pattern interferometry are well-established non-contact measurement methods. They have been widely used to carry out precise deformation mapping.
Yunlong Zhu, J. Vaillant, G. Montay, M. François, Y. Hadjar, A. Bruyant   +5 more
semanticscholar   +1 more source

Electronic Speckle Pattern Interferometry

SPIE Proceedings, 1987
AbstractThe basic principles of electronic speckle pattern interferometry (ESPI) are described, stressing its close similarity to hologram interferometry. The technique's applications for vibration anddeformation testing within industrial and medical research are outlined. Future developments are discussed.
openaire   +2 more sources

Electronic speckle pattern interferometry (ESPI)

Optics and Lasers in Engineering, 1989
Abstract Electronic Speckle Pattern Interferometry (ESPI) is becoming a very common test and measurement tool among industrial users. In its present form it rivals any current techniques for speed and ease of use. With improvements in image quality it has the potential to become the definitive tool for non-destructive testing.
openaire   +2 more sources

Electronic speckle pattern interferometry on a microscopic scale

Journal of Nondestructive Evaluation, 1994
An electronic speckle pattern interferometer that incorporates a commercial, long-working-distance microscope is described which provides new opportunities to perform nondestructive inspection for applications in fields such as microelectronics. The long-working-distance microscrope was attached directly to the CCD camera to form a compact, portable ...
James W. Wagner, John B. Deaton, Robert S. Rogowski   +2 more
openaire   +2 more sources

Pulsed lasers in electronic speckle pattern interferometry

Optics & Laser Technology, 1978
Abstract This paper describes the incorporation of a pulsed ruby laser into an electronic speckle pattern interferometer. A technique is described for observing vibrational and transient events with a double pulsed laser and some typical results are given. Results of the application of the interferometer to non-destructive testing are included.
T.J. Cookson, J.N. Butters, H.C. Pollard
openaire   +2 more sources