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Methods of phase reconstruction for time-averaging electronic speckle pattern interferometry.

Applied Optics, 2016
Electronic speckle pattern interferometry is useful for the qualitative depiction of the deformation profile of harmonically vibrating objects.
T. Statsenko   +3 more
semanticscholar   +1 more source

Fringe Visibility In Electronic Speckle Pattern Interferometry

SPIE Proceedings, 1987
In electronic speckle pattern interferometry, the visibility of resultant fringes are influenced by inhomogeneity of the object light and the reference light. Moreover, the resultant fringes have granularity, which is the drawback of ESPI. Two methods to improve the visibility of resultant fringes are proposed.
Motoki Yonemura, Shigeru Hagihara
openaire   +2 more sources

Deformation reconstruction by means of surface optimization. Part I: Time-averaged electronic speckle pattern interferometry.

Applied Optics, 2017
Electronic speckle pattern interferometry is a well-known experimental technique for full-field deformation measurements. Although speckle interferometry techniques were developed years ago and are widely used for the visualization of the operating ...
T. Statsenko   +3 more
semanticscholar   +1 more source

Optimum determination of speckle size to be used in electronic speckle pattern interferometry

Applied Optics, 1995
Characteristics of the fringe pattern detected by an electronic speckle pattern interferometer, in conditions in which a test object deforms in an arbitrary direction and the speckle intensity is detected over a pixel area in the TV camera to be used, have been investigated from two aspects: speckle noise reduction and fringe contrast.
Minniu Zhou   +3 more
openaire   +3 more sources

Stroboscopic illumination for electronic speckle pattern interferometry

The Journal of the Acoustical Society of America, 2015
A common realization of holographic interferometry is called Electronic Speckle Pattern Interferometry (or ESPI)—a technique capable of measuring harmonic modes of vibrating objects. We present a method of improving the contrast and quality of fringe patterns recorded with a simple, table-top ESPI system.
Colin Gavin, Steve Tufte
openaire   +2 more sources

General construction of transform-domain filters, filtering methods for electronic speckle pattern interferometry, and comparative analyses.

Applied Optics, 2016
In this paper, we first present a general method for the construction of transform-domain filters for the removal of speckle noise in electronic speckle pattern interferometry (ESPI) wrapped phase patterns.
Xia Chen   +4 more
semanticscholar   +1 more source

Gradient vector fields based on variational image decomposition for skeletonization of electronic speckle pattern interferometry fringe patterns with variable density and their applications.

Applied Optics, 2016
The skeletonization methods based on gradient vector fields (GVFs) have been a powerful tool for electronic speckle pattern interferometry (ESPI) fringe patterns. However, the skeletonization of ESPI fringe patterns with variable density has been an open
Xia Chen   +3 more
semanticscholar   +1 more source

Simultaneous displacement and slope measurement in electronic speckle pattern interferometry using adjustable aperture multiplexing.

Applied Optics, 2016
This paper suggests the use of adjustable aperture multiplexing (AAM), a method which is able to introduce multiple tunable carrier frequencies into a three-beam electronic speckle pattern interferometer to measure the out-of-plane displacement and its ...
Min Lu   +3 more
semanticscholar   +1 more source

In-plane electronic speckle pattern shearing interferometry

Optics and Lasers in Engineering, 1997
An analysis of the out-of-plane shearing interferometer has been performed which shows that production of in-plane strain partial derivatives is possible, which are not affected by out-of-plane displacement function components. The in-plane data are represented as subtraction correlation fringes.
John R. Tyrer, Jon N. Petzing
openaire   +2 more sources

Long-Distance Electronic Speckle Pattern Interferometry

Optical Engineering, 1988
Electronic speckle pattern interferometry has been used to measure the vibrations and deformations of objects located far from the optical head. Vibration recordings were made for a total path-length difference of up to 200 m with the object outdoors in bright sunshine. This limit was determined by practical considerations.
Jan T. Malmo, Ole J. Løkberg
openaire   +2 more sources

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