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Electronic speckle pattern interferometry for modal analysis
The Journal of the Acoustical Society of America, 2005Electronic speckle pattern interferometry is a common method for determining resonant frequencies and visualizing mode shapes of relatively small objects; however, the apparatus required for this type of interferometry is typically expensive and extremely sensitive to ambient vibrations.
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Dynamic Holographic-Electronic Speckle-Pattern Interferometry
Journal of Applied Mechanics, 1993The development of a nondestructive, full-field, quantitative optical technique, and its feasibility to study dynamic deformations of opaque and diffusively reflecting solids under transient loads, are discussed. The technique involves recording a sequence of dynamically changing two-beam speckle interference patterns (also called holographic speckle ...
Sridhar Krishnaswamy +2 more
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Notes on the application of Electronic Speckle Pattern Interferometry
Optics and Lasers in Engineering, 1997The application of ESPI for 3D deformation measurement in material testing, dimensioning of structures and quality control, requires a stable and compact interferometric device. This device can be realized by optoelectronic components as laser diodes, fiber optics and CCD cameras. The developed interferometer is not only suitable for analysis of static
B. Breuckmann +4 more
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Contouring by Electronic speckle Pattern Interferometry (ESPI)
SPIE Proceedings, 1986A method of optically contouring object surfaces for inspection purposes, based on electronic speckle pattern interferometry is described. The technique forms a "bolt-on" addition to existing ESPI systems. It is shown that the correlation fringe contours thus obtained are equivalent to those of projected, two-beam interference fringe contours ...
B. D. Bergquist, P. Montgomery
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Electronic Speckle Pattern Interferometry for Micromechanical Measurements
Advanced Engineering Materials, 2002A new optical setup that could be used for the analysis of displacement (or strain) of objects with diffuse as well as mirror-like reflecting (specular) surfaces is presented here together with the algorithm of data analysis. Combination of these two new approaches allows to minimize the area of analysis and to extend the class of materials to which ...
Sigitas Tamulevičius +3 more
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Electronic speckle pattern interferometry using vortex beams
Optics Letters, 2011We show that it is possible to perform electronic speckle pattern interferometry (ESPI) using, for the first time to our knowledge, vortex beams as the reference beam. The technique we propose is easy to implement, and the advantages obtained are, among others, environmental stability, lower processing time, and the possibility to switch between ...
Néstor Uribe-Patarroyo +2 more
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Interferometric comparison of displacements by electronic speckle pattern interferometry
Applied Optics, 1981Using the image waves from two similar objects as, respectively, object wave and reference wave in an electronic speckle pattern interferometer (ESPI) setup, it is possible to obtain interference patterns that indicate the amount of relative displacement between the two objects.
Ole J. Løkberg, Gudmunn Å. Slettemoen
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Synchronous Stroboscopic Electronic Speckle Pattern Interferometry
SPIE Proceedings, 1986Electronic Speckle Pattern Interferometry (E.S.P.I) oftenly called Electronic Holography is a practical powerful technique in non-destructive testing. Practical capabilities of the technique have been improved by fringe betterment and the control of analysis in the time domain, in particular, the scanning of the vibration cycle, with introduction of ...
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Vibration of flutes studied by electronic speckle pattern interferometry
Applied Optics, 1984This paper describes how electronic speckle pattern interferometry can be used to observe in real time the wall vibrations of simple flutes excited in realistic playing conditions. Dynamic interferograms were created by driving the phase-modulating mirror by means of the amplified sound signal picked up by a microphone.
Ole J. Løkberg, Ola K. Ledang
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