Results 251 to 260 of about 1,607,152 (325)

Electrostatic Discharge

Signal Integrity, 2016
S. Russ
openaire   +2 more sources

Reliability Issues of Thin Film Transistors Subject to Electrostatic Discharge Stresses: An Overview

Advanced Electronic Materials, 2021
Electrostatic discharge (ESD) is one of the most prevalent threats to the reliability of electronic components, which can result in a very high current passing through the device or microchip within a very short period of time, and cause serious ...
Yan Yan, Wen-Ting Lan, Yuankang Chen, Dong-Heo Yang, Ye Zhou, Zhihua Zhu, J. Liou   +6 more
semanticscholar   +1 more source

Lichtenberg figures presenting electrostatic discharge patterns at different humidity

Journal of Physics D: Applied Physics, 2021
Electrostatic discharge (ESD) is a phenomenon that commonly exists on the insulation surface in electrical and electronic devices at different environmental conditions.
Zhijie Shi, Chuanyang Li, Z. Lei, Yang Yang, Jinliang He, Jiancheng Song   +5 more
semanticscholar   +1 more source

Electrostatic Discharge (ESD) Behavior of p-GaN HEMTs

International Symposium on Power Semiconductor Devices and IC's, 2020
This paper shows the electrostatic discharge (ESD) behavior of p-GaN HEMTs. Based on transmission line pulse (TLP) testing, the ESD characteristics (stressed: drain versus source, drain versus gate, gate versus source, drain to substrate) are ...
Yajie Xin, Wanjun Chen, Ruize Sun, Yijun Shi, Chao Liu, Yun Xia, Fangzhou Wang, Xiaorui Xu, Qi Shi, Yuan Wang, Xiaochuan Deng, Qi Zhou, Zhaoji Li, Bo Zhang   +13 more
semanticscholar   +1 more source

Degradation Behavior and Mechanisms of E-Mode GaN HEMTs With p-GaN Gate Under Reverse Electrostatic Discharge Stress

IEEE Transactions on Electron Devices, 2020
The degradation behavior and its mechanisms of E-mode GaN high electron mobility transistors (HEMTs) with p-GaN gate under electrostatic discharge (ESD) stress were investigated. Reverse short-pulse stress was generated by a transmission line pulse (TLP)
Y. Chen, J. Feng, J. L. Wang, X. B. Xu, Z. He, G. Y. Li, D. Lei, Y. Chen, Y. Huang   +8 more
semanticscholar   +1 more source

Electrostatic discharge algorithm: a novel nature‐inspired optimisation algorithm and its application to worst‐case tolerance analysis of an EMC filter

IET Science, Measurement & Technology, 2019
Because of their several advantages like simplicity, flexibility and adaptability, nature-inspired (NI) optimisation algorithms have attracted significant attention for solving complex optimisation problems.
H. Bouchekara
semanticscholar   +1 more source

Application of Displacement-Current-Governed Triboelectric Nanogenerator in an Electrostatic Discharge Protection System for the Next-Generation Green Tire.

ACS Nano, 2019
Electrostatic discharge (ESD), a universal phenomenon derived from tribocharging and electrostatic induction, has always been regarded as a negative effect because it may cause various types of damage, such as gas explosions, wildfires, failure of ...
Wenjie Wu, Tianxiao Yang, Yuxin Zhang, Feng Wang, Q. Nie, Yong Ma, Xia Cao, Zhong Lin Wang, Ning Wang, Liqun Zhang   +9 more
semanticscholar   +1 more source

Modeling and Simulation of Comprehensive Diode Behavior Under Electrostatic Discharge Stresses

IEEE transactions on device and materials reliability, 2019
Diodes are effective devices for electrostatic discharge (ESD) protection. To accurately predict ESD robustness through circuit simulation of protection architectures in integrated circuits that use diodes, an enhanced model is proposed.
Hang Li, M. Miao, Y. Zhou, J. Salcedo, J. Hajjar, K. Sundaram   +5 more
semanticscholar   +1 more source

New Diode-Triggered Silicon-Controlled Rectifier for Robust Electrostatic Discharge Protection at High Temperatures

IEEE Transactions on Electron Devices, 2019
The diode-triggered silicon-controlled rectifier (DTSCR) is an important device for the electrostatic discharge (ESD) protection of low-voltage integrated circuits, and its trigger voltage is determined by the forward turn-on voltage of diode string and ...
Fei Hou, Jizhi Liu, Zhiwei Liu, Wen Huang, Tianxun Gong, Bin Yu, J. Liou   +6 more
semanticscholar   +1 more source

Research of Noise Immunity of Computing Equipment under Exposure of Electrostatic Discharge

2019 International Russian Automation Conference (RusAutoCon), 2019
Automated object management systems are built on the basis of computing equipment, which must meet the requirements for noise immunity. Electrostatic discharge is a common natural source of electromagnetic interference.
Z. Gizatullin, M. Shkinderov
semanticscholar   +1 more source