Results 1 to 10 of about 37,056 (285)
Study on Micro Interfacial Charge Motion of Polyethylene Nanocomposite Based on Electrostatic Force Microscope. [PDF]
Polymers (Basel), 2019 The interface area of nano-dielectric is generally considered to play an important role in improving dielectric properties, especially in suppressing space charge. In order to study the role of interface area on a microscopic scale, the natural charge and injected charge movement and diffusion on the surface of pure LDPE and SiO2/LDPE nanocomposite ...
Han B +6 more
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Quantitative Membrane Electrostatics with the Atomic Force Microscope [PDF]
Biophysical Journal, 2006 The atomic force microscope (AFM) is sensitive to electric double layer interactions in electrolyte solutions, but provides only a qualitative view of interfacial electrostatics. We have fully characterized silicon nitride probe tips and other experimental parameters to allow a quantitative electrostatic analysis by AFM, and we have tested the validity
Yi Yang +2 more
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Modular apparatus for electrostatic actuation of common atomic force microscope cantilevers [PDF]
Review of Scientific Instruments, 2015 Piezoelectric actuation of atomic force microscope (AFM) cantilevers often suffers from spurious mechanical resonances in the loop between the signal driving the cantilever and the actual tip motion. These spurious resonances can reduce the accuracy of AFM measurements and in some cases completely obscure the cantilever response.
Christian J. Long, Rachel J. Cannara
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Electrostatically Balanced Subnanometer Imaging of Biological Specimens by Atomic Force Microscope [PDF]
Biophysical Journal, 1999 To achieve high-resolution topographs of native biological macromolecules in aqueous solution with the atomic force microscope (AFM) interactions between AFM tip and sample need to be considered. Short-range forces produce the submolecular information of high-resolution topographs.
Daniel J. Müller +4 more
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Atomic force microscope based biomolecular force-clamp measurements using a micromachined electrostatic actuator [PDF]
Ultramicroscopy, 2012 The authors describe a method for biomolecular force clamp measurements using atomic force microscope (AFM) cantilevers and micromachined membrane-based electrostatic actuators. The actuators comprise of Parylene membranes with embedded side actuation electrodes and are fabricated on a silicon substrate.
Hamdi Torun +2 more
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Large area scanning probe microscope in ultra-high vacuum demonstrated for electrostatic force measurements on high-voltage devices [PDF]
Beilstein Journal of Nanotechnology, 2015 Background: The resolution in electrostatic force microscopy (EFM), a descendant of atomic force microscopy (AFM), has reached nanometre dimensions, necessary to investigate integrated circuits in modern electronic devices.
Urs Gysin +6 more
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KONA Powder and Particle Journal, 2014 A single particle is brought into contact with a metal target, and the force acting on the particle is measured by using atomic force microscope (AFM). By focusing on measuring the force ‘curve’, rather than looking
Tatsushi Matsuyama +2 more
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Electrostatic force microscope for probing surface charges in aqueous solutions. [PDF]
Proceedings of the National Academy of Sciences, 1995 A scanning force microscope was converted to an electrostatic force microscope by charging the usually neutral cantilever with phospholipids. The electrostatic force microscope was used to study surface electrostatic charges of samples in aqueous solutions.
Shaohua Xu, Morton F. Arnsdorf
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Micromachining with a force microscope tip assisted by electrostatic force [PDF]
Review of Scientific Instruments, 1996 We present a new technique for surface modification with a force microscope tip. By using electrostatic force between a cantilever and a sample surface, deformation on the surface can be performed with a very large load on the order of 10−6 N, even if the spring constant of the cantilever is small (on the order of 10−2 N/m).
Kazuya Goto, Kazuhiro Hane
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Numerical modelling of electrostatic force microscopes considering charge and dielectric constant [PDF]
COMPEL - The international journal for computation and mathematics in electrical and electronic engineering, 2009 PurposeThe purpose of this paper is to present a hybrid numerical simulation approach for the calculation of potential and electric field distribution considering charge and dielectric constant.Design/methodology/approachEach numerical method has its own advantages and disadvantages.
Uzzal Binit Bala +3 more
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