Results 11 to 20 of about 37,056 (285)
Journal of Advanced Mechanical Design, Systems, and Manufacturing, 2014 A new scan mode referred to as the feed-forward controlled unidirectional scan mode is employed to improve the accuracy of surface profile measurement of micro-optics in a scanning electrostatic force microscope (SEFM) instead of the conventional ...
Zhigang JIA +4 more
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Quantum Transport and Molecular Sensing in Reduced Graphene Oxide Measured with Scanning Probe Microscopy [PDF]
MoleculesWe report combined scanning probe microscopy and electrical measurements to investigate local electronic transport in reduced graphene oxide (rGO) devices.
Julian Sutaria, Cristian Staii
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Biophysical Journal, 1991 In atomic force microscopy, the tip experiences electrostatic, van der Waals, and hydration forces when imaging in electrolyte solution above a charged surface. To study the electrostatic interaction force vs distance, curves were recorded at different salt concentrations and pH values.
Hans‐Jürgen Butt
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Journal of the Society of Powder Technology, Japan, 2006 A single particle is brought into contact with a metal target, and the force acting on the particle is measured by using an atomic force microscope (AFM). Focusing on the measurement of force curve rather than the maximum adhesive force, the electrostatic interaction was successfully observed by separating it from other interations such as liquid ...
Tatsushi Matsuyama +2 more
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Colloids and Surfaces A: Physicochemical and Engineering Aspects, 2011 Abstract A combination of small parallel plate condenser with Indium Tin Oxide (ITO) glass slides as electrodes and an atomic force microscope (AFM) is used to characterize the electrostatic behavior of single glass bead microparticles (105–150 μm) glued to the AFM cantilever. This novel setup allows measurements of the electrostatic forces acting on
Jin Wang Kwek +4 more
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Biophysical Journal, 1997 In biological applications of atomic force microscopy, the different surface properties of the biological sample and its support become apparent. Observed height differences between the biomolecule and its supporting surface are thus not only of structural origin, but also depend on the different sample-tip and support-tip interactions. This can result
Daniel J. Müller, Andreas Engel
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UHV Electrostatic Force Microscope. Methods to Obtain High-Resolution Electrical Information.
Hyomen Kagaku, 1997 Takahito Inoue
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Ultramicroscopy, 2006 A time-resolved method for tip' retraction at micros-scale away from dielectric surfaces has been developed. Analysis of the forces in the system comprising AFM tip, water meniscus, and polymer film suggests that an electrostatic repulsion of the tip from the surface in the double-layered (water and polymer) system, and water condensation in the tip ...
Sergei F. Lyuksyutov +6 more
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190 A scanning electrostatic force microscope for surface profile measurement
The Proceedings of Conference of Tohoku Branch, 2013 Keiichiro Hosobuchi +5 more
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Enhancement of non-contact friction between metal surfaces induced by the electrical double layer
Applied Surface Science Advances, 2021 Casimir and electrostatic non-contact friction between two gold plates, and a gold tip and a gold plate, are calculated taking into account the contribution of the electrical double layer.
A.I. Volokitin
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