Results 221 to 230 of about 37,056 (285)
Interfacial Roughness-Reinforced Magnetic Nanosheet Colloidal Gels for Stable Embolization and Magnetothermal Therapy of Hepatic Tumor. [PDF]
Adv Sci (Weinh)Liu X +11 more
europepmc +1 more source
Applied Surface Science, 2002 Abstract We investigate the ‘artifact’ included in Kelvin probe force microscopy (KPFM). We theoretically show that the artifact due to the applied AC field cannot be canceled by conventional KPFM and that the artifact signal can be detected from the force signal through the second harmonic component of AC field.
Kenji Okamoto +2 more
openalex +2 more sources
Surface potential analysis on doping superlattice by electrostatic force microscope
Applied Surface Science, 2002 We have studied the surface potential profile of the doping superlattice by observing the cleaved edge of the doping superlattice sample with the electrostatic force microscope (EFM). The surface potential of the structure is estimated from the two frequency components of the electrostatic force between the EFM probe and the superlattice structure ...
Y. Katano +3 more
openalex +2 more sources
Molecular charge mapping with electrostatic force microscope
SPIE Proceedings, 1993 Abstract We are attempting charge mapping & potentiometry on biological and molecular systems using a modifiedAtomic Force Microscope(AFM) — ElectrostaticForce Microscope(EFM). With an interferometric detection system,we have obtained potentiometric sensitivity better than 0.1 mV and spatial resolution of about 200A.
Y. Leng, C. C. Williams
openalex +2 more sources
Electrostatic interactions observed when imaging proteins with the atomic force microscope
Ultramicroscopy, 2003 The atomic force microscope (AFM) is now an established and valuable tool for the study of biological macromolecules in aqueous environments. In this paper we form a patterned boundary via the microcontact printing of individually isolated proteins, covalently attached to a solid support.
Joana Rossell +5 more
openalex +3 more sources
Cantilever contribution to the total electrostatic force measured with the atomic force microscope
Measurement Science and Technology, 2009 The atomic force microscope (AFM) is a powerful tool for surface imaging at the nanometer scale and surface force measurements in the piconewton range. Among long-range surface forces, the electrostatic forces play a predominant role. They originate if the electric potentials of the substrate and of the tip of the AFM cantilever are different.
Svetlana Guriyanova +2 more
openalex +3 more sources
Integrated electrostatically resonant scan tip for an atomic force microscope
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 1993 The atomic force microscope (AFM) has become a practical tool for mapping surface features with a resolution better than 10 nm. As such, in recent years the demand from industry for the AFM has increased significantly. For the AFM to be a practical instrument, however, its operation must be user friendly and its performance must be consistent.
Lingjiang Kong, B. G. Orr, K.D. Wise
openalex +2 more sources
Novel Atomic Force Microscope Probes with Integrated Electrostatic Actuation and Optical Detection
LEOS 2007 - IEEE Lasers and Electro-Optics Society Annual Meeting Conference Proceedings, 2007 In this work, a new class of atomic force microscope (AFM) probe, called force-sensing integrated readout and active tip (FIRAT), is developed. It combines several micromechanical devices (MEMS) techniques, diffraction based optical sensing and electrostatic actuation, to improve the speed and sensitivity of AFM systems for imaging and force ...
F. Levent Degertekin
openalex +2 more sources