Results 231 to 240 of about 37,056 (285)
Electrostatic force microscope imaging analyzed by the surface charge method
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 1993 The electrostatic force acting between the probe of the force microscope and the sample surface is theoretically investigated by using the surface charge method. The actual shapes of the probe (an etched tungsten wire) and the sample (gratinglike electrodes) which are used in the experiments are considered to calculate the electrostatic forces ...
S. Watanabe +4 more
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Detection and control of ferroelectric domains by an electrostatic force microscope
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 1998 An electrostatic force microscopy (EFM) method has been used for the detection and control of the microdomain in ferroelectric single crystal [triglycine sulfate (TGS)] and thin film piezoelectric transducer (PZT). In this method, EFM is operated in a dynamic contact mode that allows a simultaneous measurement of the topographic and domain contrast ...
Junsung Hong +4 more
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Measurement of the contact potential difference with an electrostatic force microscope
European Journal of Physics, 2001 In this paper we present a method for the measurement of the contact potential difference (CPD) using an electrostatic force microscope. Nowadays, as with many other scanning force microscopes, the electrostatic force microscope enables the realization of multi-acquisition and thus the simultaneous observation of a topographic image and an image ...
Rodrigue Rousier +2 more
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Capacitive effects on quantitative dopant profiling with scanned electrostatic force microscopes
Journal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures Processing, Measurement, and Phenomena, 1996 A force-based scanning Kelvin probe microscope has been applied to the problem of dopant profiling in silicon. Initial data analysis assumed the detected electrostatic force couples the sample and only the tip at the end of a force sensing cantilever.
Todd Hochwitz +4 more
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Review of Scientific Instruments, 1997 We report a noninvasive high speed voltage sampling technique by using atomic force microscope. This technique is based on the mixing of interaction forces between a conductive probe-tip and a device interconnect line. Mixing phenomena allow measurements of signals with frequencies far above the mechanical resonance frequency of the cantilever.
Junsung Hong +3 more
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Applied Surface Science, 2002 Abstract Scanning probe microscope with a dc bias and an ac modulation signal applied to the probing tip has been quite successful for investigating the characteristics in a sub-micron scale for the high density ferroelectric memory application field.
Sungchul Shin +5 more
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Japanese Journal of Applied Physics, 2001 Noncontact atomic force microscope (NC-AFM) with and without scanning Kelvin probe force microscope (SKPM) has been studied to clarify the effect of an electrostatic force between a cantilever tip and a specimen on the NC-AFM imaging. The NC-AFM image contrast of a quenched Si (111) surface reflected the distribution of the surface potential, while
Tadashi Shiota, Keiji Nakayama
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Mapping Local Electrostatic Forces with the Atomic Force Microscope
Langmuir, 1997We have used an atomic force microscope (AFM) to measure locally electrostatic interaction between the AFM's tip and a charged surface. We investigated small amphiphilic positively charged bilayer patches adsorbed to the negatively charged mica surface in various electrolytes at different concentrations.
Christian Rotsch, Manfred Radmacher
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Prototyping Electrostatic Scanning Force Microscope
Volume 4: 23rd Design for Manufacturing and the Life Cycle Conference; 12th International Conference on Micro- and Nanosystems, 2018A scanning force microscope combining commercial AFM probes, printed circuit boards, and electrostatic actuation and detection is proposed and demonstrated. The electrostatic actuator is formed by the AFM probe and a fixed trace on a PCB. It is driven by a biased harmonic voltage with a frequency close to the probe’s resonant frequency.
Hamidreza Nafissi +2 more
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Electrostatic force-feedback force sensor incorporated in an ultrahigh vacuum force microscope
Review of Scientific Instruments, 2000A force sensor based on a fiber-optic interferometric displacement transducer incorporated in an ultrahigh vacuum atomic force microscope is described. The operation of the sensor is based on balancing the tip-sample interfacial force using an electrostatic actuator.
V. Yakimov, R. Erlandsson
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