Results 241 to 250 of about 37,056 (285)

Electrostatic writing and imaging using a force microscope

Conference Record of the 1990 IEEE Industry Applications Society Annual Meeting, 1992
A modified force microscope-the electrostatic force microscope (EFM)-has been used to study the charging properties of a polymer surface. A polycarbonate surface was charged by placing a small voltage on a tungsten microscope tip and touching the tip to the surface.
F. Saurenbach, B.D. Terris
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Electrostatic energy characterization for an atomic force microscope probe

2008 1st Microsystems and Nanoelectronics Research Conference, 2008
An accurate model for the total electrostatic energy associated with an atomic force microscope probe (AFM) has been developed. Unlike other models, the model takes account of the electrostatic energy associated with the fringing field capacitances between the AFM probe cantilever and the substrate to result in a more accurate energy expression.
Liton Ghosh, Sazzadur Chowdhury
openaire   +1 more source

Measuring Electrostatic Double-Layer Forces at High Surface Potentials with the Atomic Force Microscope

The Journal of Physical Chemistry, 1996
The aim of this study was to measure interaction forces between surfaces with high electric potentials in aqueous electrolyte solutions. Therefore, the force between a platinum or gold sample, which served as the working electrode, and a silicon nitride tip of an atomic force microscope was measured.
RAITERI, ROBERTO, M. GRATTAROLA, H. J. BUTT   +2 more
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Charge Distribution of Cytochrome c Monolayer Using Electrostatic Force Microscope

Molecular Crystals and Liquid Crystals, 2002
The charge trapping of the cytochrome c was investigated by electrostatic force microscopy (EFM). The cytochrome c was modified by SPDP and deposited onto the gold substrate by self-assembly technique. The charge was transported to heme groups of cytochrome c by scanning tunneling microscopy (STM) tip, and it was verified that the charge was trapped ...
JEONG-WOO CHOI, SEI-JEONG PARK, CHANG-JUN YOO, SE YOUNG OH, WON HONG LEE   +4 more
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High speed atomic force microscope lithography driven by electrostatic interaction

Applied Physics Letters, 2007
This letter paper describes a scanning probe lithography method for fabricating patterns of various nanoparticles on SiOx∕Si substrate. The electrostatic interaction resulting from the charge separation caused by the friction between the atomic force microscope (AFM) tip and the substrate was utilized as the driving force for the deposition of ...
Ding, Lei, Li, Yan, Chu, Haibin, Li, Changqing, Yang, Zhaohui, Zhou, Weiwei, Tang, Zi Kang   +6 more
openaire   +2 more sources

A noncontact scanning electrostatic force microscope for surface profile measurement

CIRP Annals, 2012
Abstract A scanning electrostatic force microscope is presented for noncontact surface profile measurement. A charged conducting probe tip is oscillated by a tuning fork quartz crystal resonator. The probe tip is scanned over the sample surface by using an XY scanner in such a way that the frequency shift of the tuning fork oscillation, which ...
Wei Gao, Shigeaki Goto, Keiichiro Hosobuchi, So Ito, Yuki Shimizu   +4 more
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Scanned electrostatic force microscope for noninvasive high frequency potential measurement

Applied Physics Letters, 1994
This letter presents a technique for performing localized noncontact measurements of high frequency signals on integrated circuits using a scanned force microscope. The technique extracts the amplitude and phase of the signal voltage at a point on the circuit by nulling the electrostatic force interaction between a small driven probe and the test point.
Ra’a A. Said, Greg E. Bridges, Doug J. Thomson   +2 more
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Hybrid Numerical Simulation of Electrostatic Force Microscopes Considering Charge Distribution

PIERS Online, 2007
The electrostatic force microscope (EFM) is an important tool for imaging and characterizing material surfaces. In this paper a hybrid numerical approach for the simulation of the EFM considering charge distribution inside the sample under investigtion is presented. In the simulation model electrical part is considered.
Uzzal Binit Bala, Michael Greiff, W. Mathis   +2 more
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Electrostatic interaction of an atomic force microscope probe with a sample surface

Technical Physics Letters, 2010
Electrostatic forces acting on the charged probe of an atomic-force microscope near a grounded conducting sample surface with or without a thin dielectric coating are calculated by numerically solving the Laplace equation for the electric potential in this system.
G. V. Dedkov, A. A. Kanametov
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Drift reduction in a scanning electrostatic force microscope for surface profile measurement

Measurement Science and Technology, 2014
The influence of drifts on the measurement results of an electrostatic force microscope (EFM) based on a dual-height method for surface profile measurement is analyzed. Two types of drifts and their influence on the EFM measurement are discussed by computer simulation.
Zhigang Jia, So Ito, Shigeaki Goto, Keiichiro Hosobuchi, Yuki Shimizu, Wei Gao   +5 more
openaire   +1 more source