Results 281 to 290 of about 148,798 (321)

Multifrequency Atomic Force Microscopy: Compositional Imaging with Electrostatic Force Measurements

Microscopy and Microanalysis, 2011
AbstractWe demonstrate that single-pass Kelvin force microscopy (KFM) and dC/dz measurements in different environments expand the compositional imaging with atomic force microscopy. The KFM and dC/dz studies were performed in the intermittent contact mode with force gradient detection of tip-sample electrostatic interactions. Both factors contribute to
Sergei, Magonov, John, Alexander
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Quantitative electrostatic force microscopy with sharp silicon tips

Nanotechnology, 2014
Electrostatic force microscopy (EFM) probes are typically coated in either metal (radius ∼ 30 nm) or highly-doped diamond (radius ∼ 100 nm). Highly-doped silicon probes, which offer a sharpened and stable tip apex (radius ∼ 1-10 nm) and are usually used only in standard atomic force microscopy, have been recently shown to allow enhanced lateral ...
Fumagalli, L., Edwards, MA, Gomila, G
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Electrostatic nanolithography in polymers using atomic force microscopy

Nature Materials, 2003
The past decade has witnessed an explosion of techniques used to pattern polymers on the nano (1-100 nm) and submicrometre (100-1,000 nm) scale, driven by the extensive versatility of polymers for diverse applications, such as molecular electronics, data storage, optoelectronics, displays, sacrificial templates and all forms of sensors.
Sergei F, Lyuksyutov, Richard A, Vaia, Pavel B, Paramonov, Shane, Juhl, Lynn, Waterhouse, Robert M, Ralich, Grigori, Sigalov, Erol, Sancaktar   +7 more
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Emerging Techniques in Atomic Force Microscopy: Diamond Milling and Electrostatic Force Microscopy

EDFA Technical Articles, 2015
Abstract Atomic force microscopy has been a consistent factor in the advancements of the past decade in IC nanoprobing and failure analysis. Over that time, many new atomic force measurement techniques have been adopted by the IC analysis community, including scanning conductance, scanning capacitance, pulsed current-voltage, and ...
Stephen Ippolito, Sean Zumwalt, Andy Erickson   +2 more
openaire   +1 more source

Tapping mode atomic force microscopy using electrostatic force modulation

Applied Physics Letters, 1996
We have developed a simple tapping mode in atomic force microscopy using a capacitive electrostatic force. In this technique, the probe-to-sample distance is modulated by the capacitive force between tip and sample induced by a sinusoidal bias applied to the conductive probe instead of a conventional mechanical vibration. The electrostatic force versus
J. W. Hong, Z. G. Khim, A. S. Hou, Sang-il Park   +3 more
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Characterization of electrostatic force for scanning electrostatic force microscopy of micro-structured surface

International Journal of Precision Engineering and Manufacturing, 2013
This paper presents the electrostatic force characterization of a prototype scanning electrostatic force microscope (SEFM) system developed for surface profile measurement in noncontact condition. In the SEFM system, with applying a dual height method, the distance between the probe tip and the sample surface can be accurately obtained by removing the ...
Zhigang Jia, So Ito, Keiichiro Hosobuchi, Shigeaki Goto, Yuki Shimizu, Gaofa He, Wei Gao   +6 more
openaire   +1 more source

Electrostatics of Individual Single-Walled Carbon Nanotubes Investigated by Electrostatic Force Microscopy

Physical Review Letters, 2005
We report an experimental study of static charge distribution in individual single-walled carbon nanotubes grown on a Si+115 nm SiO2 substrate. From these experiments, we conclude that charges are distributed uniformly along the nanotubes. We demonstrate that electrostatic force microscopy can accurately measure the amount of charges per unit length ...
M, Paillet, P, Poncharal, A, Zahab
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Nanoscale dielectric measurements from electrostatic force microscopy

Modern Physics Letters B, 2014
Electrostatic force microscopy has evolved as a standard tool for electrical characterization of surfaces with high lateral resolution. Key to its success is an accurate and informative model of the cantilever capacitance. In this brief review, we summarize the progress made in the dielectric characterization of surfaces using electrostatic force ...
Bharat Kumar, Scott R. Crittenden
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Electrostatic Force Imaging by Tunneling Acoustic Microscopy

Japanese Journal of Applied Physics, 1991
A new method for detecting the electrostatic force between a tip and a sample is presented. A voltage applied to the tip generates a strain which is proportional to the electrostatic force in the sample. By modulating the voltage, the strain is transmitted in the sample as a wave and is detected using a piezoelectric transducer coupled to the ...
Keiji Takata, Takehiro Okawa Takehiro Okawa, Masatada Horiuchi Masatada Horiuchi   +2 more
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Electrostatic Force Microscopy and Kelvin Force Microscopy as a Probe of the Electrostatic and Electronic Properties of Carbon Nanotubes

2009
This chapter addresses recent experimental studies on carbon nanotubes and nanotube devices using electrical techniques derived from atomic force microscopy. Electrostatic force microscopy (EFM), Kelvin force microscope (KFM), and their variants are introduced.
Melin, Thierry, Zdrojek, Mariusz, Brunel, David   +2 more
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