Results 291 to 300 of about 148,798 (321)
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Effective tip radius in electrostatic force microscopy
Applied Physics Letters, 2005A method to determine the effective electrostatic tip radius of arbitrarily shaped conducting tips in atomic force microscopy is presented. The method is based on the finding that for conductive samples, the electrostatic force can be separated into two contributions: one from a constant background that depends only on the macroscopic shape of the tip (
G. M. Sacha +5 more
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Cantilever effects on electrostatic force gradient microscopy
Applied Physics Letters, 2004The effects of the cantilever on electrostatic force microscopy are discussed. Numerical calculations of the electrostatic potential distribution and force gradient for typical experimental geometries are presented. A simple analytical relation between the calculated force gradients with and without cantilever is found.
G. M. Sacha, J. J. Sáenz
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Time-resolved electrostatic force microscopy of polymer solar cells
Nature Materials, 2006Blends of conjugated polymers with fullerenes, polymers, or nanocrystals make promising materials for low-cost photovoltaic applications. Different processing conditions affect the efficiencies of these solar cells by creating a variety of nanostructured morphologies, however, the relationship between film structure and device efficiency is not fully ...
David C, Coffey, David S, Ginger
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Imaging Channel Connectivity in Nafion Using Electrostatic Force Microscopy
The Journal of Physical Chemistry B, 2018Channel connectivity is an important material property that is considered in making higher-performance proton-exchange membranes. Our group has previously demonstrated that nearly 50% of the aqueous surface domains in Nafion films do not have a connected path to the opposite side of the membrane.
Austin M. Barnes, Steven K. Buratto
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Compensating electrostatic forces by single-scan Kelvin probe force microscopy
Nanotechnology, 2007We describe a novel method of single-scan Kelvin probe force microscopy, operating simultaneously with amplitude-modulation distance control in ambient air. A separate Kelvin probe feedback control loop compensates for potential differences between tip and sample by minimizing electrostatic forces.
Dominik Ziegler +3 more
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Variational treatment of electrostatic interaction force in atomic force microscopy
Zeitschrift für angewandte Mathematik und Physik, 2007The authors discuss a computational method which allows the authors to determine the electrostatic interaction force between an atomic force microscope tip and the sample surface. After formulating the corresponding boundary value problem in a Sobolev space setting, the authors find the weak solution in the form of the integral potential.
Shmoylova, E. +2 more
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Modeling electrostatic scanning force microscopy of semiconductors
Materials Science and Engineering: B, 1996Abstract A model is presented for the electrostatic interaction between the tip of a scanning force microscope and the surface of a semiconductor in condition of depletion. By representing the tip as a conducting sphere and suitably approximating the semiconductor space-charge region, analytical expressions are derived for the boundary of this region
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Electrostatic Force Microscopy Techniques for Interphase Characterization
2018Atomic force microscopy (AFM) allows profiling of solid surfaces with nanometer-scale resolution. For characterization of interphases, the transition region can be imaged by suitable sample preparation, exposing a cross-sectional surface by, for example, cleavage or cutting by microtomy.
Massimiliano Labardi +2 more
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