Spectroscopic ellipsometry study of the chemical bonds of carbon films
, 2003 Dang Mo
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High‐Throughput Ellipsometric Contrast Microscopy of Lateral 2D Heterostructures for Optoelectronics
Small Methods, EarlyView.Ellipsometric contrast microscopy (ECM) is demonstrated to evaluate 2D lateral monolayer MoSe2‐WSe2 and MoS2‐WS2 heterostructures, which enables rapid imaging with high material‐contrast down to sub‐nanometer thickness for high‐throughput characterisation of heterostructure domains.
Teja Potočnik +11 more
wiley +1 more source
Substrate Activated Conformal Deposition Through Interfacial Control by a Soft Energy Intensification Process for Functional Integration in High Performance Artificial Intelligence Computing. [PDF]
ACS OmegaKaloyeros AE, Arkles B.
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Imaging ellipsometry mapping of photo-induced refractive index in As2S3 films
, 2013 Christian Röling +6 more
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Atomic Force Microscopy for Cross‐Disciplinary Materials Research
Small Methods, EarlyView.This figure demonstrates the broad applicability of atomic force microscopy (AFM) across interdisciplinary materials research. Interlocking puzzle pieces illustrate how AFM integrates with complementary analytical techniques to provide comprehensive material characterization.
Soyun Joo +7 more
wiley +1 more source
Transition-Metal Nitrides for High-Temperature Structural Colors. [PDF]
ACS Appl Mater InterfacesLyu P +6 more
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Low Noise and Drift Reconfigurable Solution‐Processed Chalcogenide Phase Change Metasurfaces
Small Methods, EarlyView.Chalcogenide glasses, favored in reconfigurable optoelectronics, rely on costly ultra‐high vacuum‐based PVD methods. A cost‐effective, solution‐based approach to synthesize these materials, producing high‐quality antimony sulfide films with comparable phase change performance are introduced.
Mahirah Zaini +7 more
wiley +1 more source
The Influence of the Ar/N<sub>2</sub> Ratio During Reactive Magnetron Sputtering of TiN Electrodes on the Resistive Switching Behavior of MIM Devices. [PDF]
Materials (Basel)Jeżak P +3 more
europepmc +1 more source
Direct Measurement of Density for Evaporated Thin Films
Small Methods, EarlyView.We present a simple, direct method to measure the true density of vapor‐deposited thin films using profilometry, microscopy, and high‐vacuum TGA. Unlike conventional approaches, it avoids assumptions about crystallinity or bulk properties. Demonstrated across OLED, OPV, and OTFT materials, this technique provides accurate density values critical for ...
Trevor Plint +3 more
wiley +1 more source