Results 71 to 80 of about 108,055 (299)

INTER-TRACHEID AND CROSS-FIELD PITTING IN COMPRESSION AND OPPOSITE WOOD OF

open access: yesBioResources, 2009
Inter-tracheid and cross-filed pit pairs in compression and opposite wood of Norway spruce (Picea abies) were examined. The size, appearance, and frequency of bordered pits on the radial side of axial tracheids and their aperture specification were ...
Asghar Tarmian, Mohammad Azadfallah
doaj  

Facile Synthesis of Copper-Coated-Reduced-Graphene-Oxide and Its Application as a Highly Sensitive Electrochemical Sensor for Hydroquinone

open access: yesJournal of Chemistry, 2022
A facile step-by-step approach for synthesizing copper nanoparticles (CuNPs) loaded on the wrinkled surface of reduced-graphene-oxide (Cu/rGO) was conducted using a reductant at room temperature.
Youzhi Yao
doaj   +1 more source

Hydrogen‐Assisted Fracture of Iron‐Based Fe–Ni–Al Alloys

open access: yesAdvanced Engineering Materials, EarlyView.
Principal relations and fracture mechanisms of single‐phase and precipitate‐strengthened Fe–Ni–Al alloys subjected to prior electrochemical hydrogen charging are identified. The mechanisms of hydrogen effect on strength and microhardness are discussed, including hydrogen‐induced increase in microhardness and the role of hydrogen in fracture behavior ...
Nataliya Yadzhak   +3 more
wiley   +1 more source

Mathematical-Physics Analyses of the Nozzle Shaping at the Aperture Gas Outlet into Free Space under ESEM Pressure Conditions

open access: yesSensors
The paper presents a methodology that combines experimental measurements and mathematical-physics analyses to investigate the flow behavior in a nozzle-equipped aperture associated with the solution of its impact on electron beam dispersion in an ...
Pavla Šabacká   +8 more
doaj   +1 more source

Adaptation of scanning electron microscope to environmental scanning electron microscope

open access: yes, 2003
This paper deals with adaptation of the scanning electron microscope (SEM) to the environmental scanning electron microscope (ESEM). It focuses especially to the construction and assembly of the differential pumping chamber together with the detector ...
Neděla, Vilém
core  

Influence of Test Temperature and Test Frequency on Fatigue Life of Aluminum Alloy EN AW‐2618A

open access: yesAdvanced Engineering Materials, EarlyView.
The influence of test temperature and test frequency on the fatigue life of EN AW‐2618A is investigated. High‐cycle fatigue tests are performed at different test temperatures and frequencies on the 1000 h/230°C overaged state. Both test parameters reduce fatigue life due to time‐dependent damage mechanisms.
Ying Han   +5 more
wiley   +1 more source

Dynamic Studies of Materials Using the Environmental Scanning Electron Microscope

open access: yes, 1990
Dynamic studies allow the observation of microscopical changes of materials over time as various factors alter an object. Using this methodology, processes important in art conservation and archaeology such as the wetting and drying of consolidated and ...
Eric Doehne, Dusan Stulik
core   +1 more source

Combined Kelvin probe force microscopy and secondary ion mass spectrometry for hydrogen detection in corroded 2024 aluminium alloy [PDF]

open access: yes, 2013
The capability of Kelvin probe force microscopy (KFM) to detect and locate hydrogen in corroded 2024 aluminium alloy was demonstrated. Hydrogen was introduced inside the 2024 alloy following a cyclic corrosion test consisting of cycles of immersion in 1 ...
Blanc, Christine   +5 more
core   +1 more source

Current Status and Challenges in Data Collection for Aerospace Coatings Deposited by Plasma Spraying

open access: yesAdvanced Engineering Materials, EarlyView.
An innovative approach has been integrated into the GRENAT project to optimize plasma spraying and coating performance. Raw materials are accelerated and melted in the plasma generated by torches, creating coatings. Monitoring sensors collect process data which are combined with ex situ characterization data.
Lila Randriamananjara   +8 more
wiley   +1 more source

Scanning ionoluminescence microscopy with a helium ion microscope

open access: yes, 2012
The ORIONR PLUS scanning helium ion microscope (HIM) images at sub nanometer resolution. Images of the secondary electron emission have superior resolution and depth of field compared to a scanning electron microscope (SEM).
Franklin, Thomas
core  

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