Results 201 to 210 of about 28,493 (254)
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2009 IEEE Custom Integrated Circuits Conference, 2009
With the scaling of CMOS technology the design of Electro-Static Discharge (ESD) protection circuits is becoming an increasingly challenging task. This challenge is mainly due to thinner gate oxide, shorter channel length, and shallower junctions.
Manoj Sachdev, Hong-Ha Vuong
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With the scaling of CMOS technology the design of Electro-Static Discharge (ESD) protection circuits is becoming an increasingly challenging task. This challenge is mainly due to thinner gate oxide, shorter channel length, and shallower junctions.
Manoj Sachdev, Hong-Ha Vuong
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Furniture ESD-the forgotten parameter in ESD testing
IEEE 1991 International Symposium on Electromagnetic Compatibility, 2002The furniture electrostatic discharge (ESD) model and the rationale for its use in determining the immunity of electronic equipment to ESD are explained. Comparisons to the hand/metal and body/finger ESD models are made. Some of the important characteristics of a device for simulating furniture ESD are discussed. >
J.S. Maas, D.J. Pratt, W. Boxleitner
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Assessment of ESD threats to electronic components and ESD control equirements
2004We propose new methods for the assessment of real electrostatic discharge (ESD) threats to electronic components in modern electronics manufacturing environment, where the devices are more sensitive to ESD than ever. The work was based on two fundamental questions: what are the key parameters of ESD that must be controlled in order to minimise risk of ...
Smallwood, Jeremy, Paasi, Jaakko
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Environmental Education Research, 2009
In 2006 the author was contracted to research possible approaches to a UK indicator of education for sustainable development (ESD). This article describes and seeks to explain the response of government advisers and influential members of the UK ESD community to the approaches he proposed.
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In 2006 the author was contracted to research possible approaches to a UK indicator of education for sustainable development (ESD). This article describes and seeks to explain the response of government advisers and influential members of the UK ESD community to the approaches he proposed.
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From the ESD robustness of products to the system ESD robustness
2004 Electrical Overstress/Electrostatic Discharge Symposium, 2004In this contribution a methodology is presented which allows the estimation of a system level ESD robustness from the ESD characterization on device level. The basic idea behind this methodology is that predominantly three different failure mechanisms exist. CDM-type stress (pulse duration ~1 ns) causes break down of dielectrics, e.g., gate oxides. The
W. Stadler +6 more
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ESD Integrity Management - An Innovation in ESD Proof Testing
Abu Dhabi International Petroleum Exhibition & Conference, 2016Abstract IEC 61511 requires periodic proof testing of SIFs to demonstrate the correct operation of the loop elements based on Safety Instrumented Function (SIF) design criteria to maintain Safety Integrity Level (SIL) ratings. Proof test serves three primary purposes within the safety lifecycle: To catch and overcome the ...
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Modified ESD Generator to Emulate Body Worn Equipment ESD and Human Skin ESD
2023 International Symposium on Electromagnetic Compatibility – EMC Europe, 2023Nikola Becanovic +3 more
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