Enhanced Survey Estimation Using Calibration under Scrambled Response and Measurement Error
Ridhi Agarwal, Yash Prakash
openalex +2 more sources
High-Precision Indoor VLP Scheme Based on the Synergy of SMO Multipath Suppression and Intelligent Algorithms. [PDF]
Sensors (Basel)Yang Y, Zhang J, Liu S.
europepmc +1 more source
A Q‐Learning Algorithm to Solve the Two‐Player Zero‐Sum Game Problem for Nonlinear Systems
International Journal of Adaptive Control and Signal Processing, Volume 39, Issue 3, Page 566-581, March 2025.A Q‐learning algorithm to solve the two‐player zero‐sum game problem for nonlinear systems. ABSTRACT This paper deals with the two‐player zero‐sum game problem, which is a bounded L2$$ {L}_2 $$‐gain robust control problem. Finding an analytical solution to the complex Hamilton‐Jacobi‐Issacs (HJI) equation is a challenging task.
Afreen Islam +2 more
wiley +1 more source
A two steps procedure in state estimation gross error detection, identification, and correction
, 2015 N.G. Bretas, Arturo S. Bretas
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Deep Learning for Age Estimation and Sex Prediction Using Mandibular-Cropped Cephalometric Images: Comparative Model Development and Validation Study. [PDF]
JMIR AIHandayani VW +5 more
europepmc +1 more source
A Robust Adaptive One‐Sample‐Ahead Preview Super‐Twisting Sliding Mode Controller
International Journal of Adaptive Control and Signal Processing, EarlyView.Block Diagram of the Robust Adaptive One‐Sample‐Ahead Preview Super‐Twisting Sliding Mode Controller. ABSTRACT This article introduces a discrete‐time robust adaptive one‐sample‐ahead preview super‐twisting sliding mode controller. A stability analysis of the controller by Lyapunov criteria is developed to demonstrate its robustness in handling both ...
Guilherme Vieira Hollweg +5 more
wiley +1 more source
A Note on parameter and standard error estimation in adaptive robust regression
, 2001 Mortaza Jamshidian
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A Robust Adaptive Filtering Framework for Smartphone GNSS/PDR-Integrated Positioning. [PDF]
Micromachines (Basel)Geng J +7 more
europepmc +1 more source
Thermoreflectance Detection of Point Defects Resulting from Focused Ion Beam Milling
Advanced Engineering Materials, EarlyView.Focused ion beam (FIB) milling is a common tool for nanoscale material processing, however irradiation damage, redeposition, and contamination can occur. We use several characterization tools to show FIB‐induced effects beyond 1 mm from the milled area.
Thomas W. Pfeifer +3 more
wiley +1 more source