Results 221 to 230 of about 495,115 (315)
Euclidean Ideal Point Estimation From Roll-Call Data via Distance-Based Bipartite Network Models
Lee, Seungju +3 more
openalex +1 more source
Maximum Euclidean distance network coded modulation for asymmetric decode‐and‐forward two‐way relaying [PDF]
Wei Chen, Zhigang Cao, Lajos Hanzo
openalex +1 more source
Combining machine learning and probabilistic statistical learning is a powerful way to discover and design new materials. A variety of machine learning approaches can be used to identify promising candidates for target applications, and causal inference can help identify potential ways to make them a reality.
Jonathan Y. C. Ting, Amanda S. Barnard
wiley +1 more source
Robust Automatic Pectoral Muscle Segmentation from Mammograms Using Texture Gradient and Euclidean Distance Regression. [PDF]
Bora VB, Kothari AG, Keskar AG.
europepmc +1 more source
Bayesian optimization enabled the design of PA56 system with just 8 wt% additives, achieving limiting oxygen index 30.5%, tensile strength 80.9 MPa, and UL‐94 V‐0 rating. Without prior knowledge, the algorithm uncovered synergistic effects between aluminum diethyl‐phosphinate and nanoclay.
Burcu Ozdemir +4 more
wiley +1 more source
Electrospinning allows the fabrication of fibrous 3D cotton‐wool‐like scaffolds for tissue engineering. Optimizing this process traditionally relies on trial‐and‐error approaches, and artificial intelligence (AI)‐based tools can support it, with the prediction of fiber properties. This work uses machine learning to classify and predict the structure of
Paolo D’Elia +3 more
wiley +1 more source
Fast Exact Euclidean Distance (FEED): A New Class of Adaptable Distance Transforms [PDF]
Theo E. Schouten, Egon L. van den Broek
openalex +1 more source
To integrate surface analysis into materials discovery workflows, Gaussian process regression is used to accurately predict surface compositions from rapidly acquired volume composition data (obtained by energy‐dispersive X‐ray spectroscopy), drastically reducing the number of required surface measurements on thin‐film materials libraries.
Felix Thelen +2 more
wiley +1 more source

