Results 151 to 160 of about 31,328 (309)

Deep Learning Inverse Design of Phase‐Change Reconfigurable Terahertz Metadevices for Multidimensional Secure Communication

Advanced Materials, EarlyView.
A deep learning inverse‐design framework is established to create versatile reconfigurable terahertz metadevices. By synergizing deep learning with phase‐change materials, this approach enables on‐demand customization of multidimensional electromagnetic responses.
Yisheng Dong, Xieyu Chen, Aarthy Nagarajan, Yi Yang, Zhihao Wang, Rui Yu, Chuang Zheng, Chunmei Ouyang, Xueqian Zhang, Tun Cao, Ranjan Singh, Zhen Tian   +11 more
wiley   +1 more source

A blockchain-enabled framework for secure and efficient data transmission in underwater sensor networks using advanced cryptographic techniques. [PDF]

Sci Rep
Kumar KK, Pavani M, Chandra NS, Chitralingappa P, Kumar BH, Anushree G.   +5 more
europepmc   +1 more source

Fault Simulating to validate fault-tolerance in Ada

, 2000
Software engineering has concentrated on provision of programming language features to support error trapping. Whilst useful, this represents only a small part of the problem of building effective diagnostics for fault tolerance. Effectiveness depends on
Chen, L, Hughes, G, May, J, Napier, J
core  

Transient Laser‐Shocked Synthesis of Amorphous Layer‐Supported Metal Nanocrystals for Efficient Nitrate Reduction

Advanced Materials, EarlyView.
A general, versatile laser‐shock synthesis process is reported to produce various bimetallic CuNi, CuFe, CuCo, and medium‐entropy CuFeCoNi heterostructures, in which crystalline metal nanoparticles are anchored to amorphous hydroxide supports. During nitrate reduction reaction, the heterostructures undergo dynamic amorphous/crystalline reconstruction ...
Weihua Guo, Jixun Zhang, Siwei Zhang, Yangbo Ma, Yun Song, Jianjun Su, Zihao Li, Yinger Xin, Qiang Zhang, Mingming He, Ruixuan Wang, Rui Xue, Shibo Xi, Ying Wang, Shenlong Zhao, Tao Yang, Zhengxiao Guo, Ben Zhong Tang, Ruquan Ye   +18 more
wiley   +1 more source

State Migration in Styx: Towards Serverless Transactional Functions. [PDF]

VLDB J
Psarakis K, Christodoulou G, Siachamis G, Fragkoulis M, Katsifodimos A.   +4 more
europepmc   +1 more source

A Porous Interfacial Photothermal Layer of Fused Core–Shell Carbon‐Polymer Nanospheres for Directional Salt Crystallization and Zero‐Liquid‐Discharge

Advanced Materials, EarlyView.
A hierarchical hydrogel evaporator with a thin, porous photothermal layer of fused core–shell carbon‐polymer nanospheres enables ultrafast interfacial solar evaporation with minimized heat loss and sufficient water supply. Directional advection‐dominated brine transport, coupled with Marangoni‐driven interfacial flow, drives salt away from the active ...
Haokun Shen, Shudi Mao, Xin Stella Zhang, Yihan Shi, Ying Long, Casey Onggowarsito, An Feng, Yuqing Yang, Jiawang Song, Leonard Tijing, Jiangtao Xu, Qiang Fu   +11 more
wiley   +1 more source

Blockchain and federated Q-learning-based secure, fault tolerant, and energy efficient framework for ad hoc networks. [PDF]

PLoS One
Tandon R, Gupta PK, Cheng X.
europepmc   +1 more source

BioEISense: A Microfluidic Platform for Real‐Time Monitoring of Staphylococcus aureus Biofilm Formation and the Efficacy of Antibiofilm Agents

Advanced Materials Interfaces, EarlyView.
BioEISense is a microfluidic device with integrated impedance sensors, for real‐time, label‐free monitoring of S. aureus biofilms. In this study, the biofilm culture conditions were optimized to support sensitive and reproducible detection of biofilm formation and eradication under dynamic flow‐through conditions. The system was also validated for both
Jéssica Amorim, Laura Vesalainen, Loïc Dreano, Markus Haapala, Cristina D. Cruz, Päivi Tammela, Tiina M. Sikanen   +6 more
wiley   +1 more source

Evolutionary reinforcement learning framework for energy-efficient fault resilience and topological stability in WSNs. [PDF]

Sci Rep
Lakshmi S, Aswath S, Swaminathan A, Haldorai A.   +3 more
europepmc   +1 more source

On-chip fault-tolerance utilizing BIST resources

, 2008
:- Widespread reliability challenges are expected for 65nm and below VLSI fabrication technologies. Effective and efficient on-chip fault-tolerance solutions are required to counter reliability challenges.
Jeffrey Draper, Sumit Dharampal Mediratta   +1 more
core