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On Undetectable Faults and Fault Diagnosis
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 2010The presence of an undetectable fault ui may modify the response of a detectable fault dj to a test set used for fault diagnosis. This may impact the accuracy of fault diagnosis based on the responses of single faults. Many state-of-the-art diagnosis processes are based on the responses of single stuck-at faults even though their goal is to diagnose ...
Irith Pomeranz, Sudhakar M. Reddy
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Fault zone fabric and fault weakness
Nature, 2009Geological and geophysical evidence suggests that some crustal faults are weak compared to laboratory measurements of frictional strength. Explanations for fault weakness include the presence of weak minerals, high fluid pressures within the fault core and dynamic processes such as normal stress reduction, acoustic fluidization or extreme weakening at ...
Collettini +7 more
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Fault density, fault types, and spectra-based fault localization
Empirical Software Engineering, 2014This paper presents multiple empirical experiments that investigate the impact of fault quantity and fault type on statistical, coverage-based fault localization techniques and fault-localization interference. Fault-localization interference is a phenomenon revealed in earlier studies of coverage-based fault localization that causes faults to obstruct,
Nicholas DiGiuseppe, James A. Jones
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Fault Collapsing for Transition Faults Using Extended Transition Faults
Eleventh IEEE European Test Symposium (ETS'06), 2006We present a fault collapsing procedure for transition faults based on fault dominance relations. The effectiveness of the procedure is enhanced by introducing what we call extended transition faults. A standard transition fault involves a single line and a transition.
Irith Pomeranz, Sudhakar M. Reddy
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Fault Density, Fault Depth and Fault Multiplicity: The Reward of Discernment
2019 IEEE 19th International Conference on Software Quality, Reliability and Security Companion (QRS-C), 2019Using a semantics-based definition of faults, we discuss three distinct but related concepts, and illustrate their differences by means of simple experiments: fault density (number of faults in a program); fault depth (the minimal number of fault removals needed to make a program correct); and fault multiplicity (the number of atomic changes needed to ...
Besma Khaireddine +2 more
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Generalization of independent faults for transition faults
Digest of Papers. 1992 IEEE VLSI Test Symposium, 2003Independent faults were shown to he effective in computing small test sets for stuck-at faults. An efficient procedure for computing a maximal set of independent stuck-at faults is proposed. The notion of independent faults is then extended to other fault models, specifically, transition faults, that require two-pattern tests.
Irith Pomeranz, Sudhakar M. Reddy
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A parameterizable fault simulator for bridging faults
Proceedings IEEE European Test Workshop, 2002We present the concept of a multiple-valued logic simulator that is able to more accurately determine the possible behavior of a circuit in the presence of bridging faults. By a user defined mapping of a range of voltages to a logic value the simulator takes care of certain voltages more closely than common bridge fault simulators that map all voltages
Piet Engelke +2 more
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On Fault Representativeness of Software Fault Injection
IEEE Transactions on Software Engineering, 2013The injection of software faults in software components to assess the impact of these faults on other components or on the system as a whole, allowing the evaluation of fault tolerance, is relatively new compared to decades of research on hardware fault injection.
Roberto Natella +3 more
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Fault collapsing of multi-conditional faults
2013 IEEE 16th International Symposium on Design and Diagnostics of Electronic Circuits & Systems (DDECS), 2013Numerous new multi-conditional fault models have been proposed in the last years. In combination with the increasing complexity of today's designs these new fault models cause a tremendous increases of the ATPG-runtime. In this paper we present a novel fault collapsing scheme for multi-conditional faults.
Rene Krenz-Baath +2 more
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Fault Diagnosis and Fault Model Aliasing
IEEE Computer Society Annual Symposium on VLSI: New Frontiers in VLSI Design (ISVLSI'05), 2005During fault diagnosis, the existence of equivalent faults, or faults that are not distinguished by the test set applied to the circuit, can create ambiguity as to the location of a defect. This happens if the circuit-under-test produces a response that matches the circuit response in the presence of two faults in different locations of the circuit ...
Irith Pomeranz +2 more
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