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Rectifier Fault Currents---II

Transactions of the American Institute of Electrical Engineers, 1949
A comprehensive procedure for the analysis of fault currents in power rectifiers has been developed and some of the more usual cases have been analyzed for the 6-phase double-Y circuit. However, further analyses are still required to cover all the conditions which may be encountered in practice and provide a ready means for determining fault currents.
C C Herskind
exaly   +4 more sources

Rectifier Fault Currents

Transactions of the American Institute of Electrical Engineers, 1945
CURRENTS in excess of normal, or fault currents, flow in rectifier circuits under conditions of arc-back or d-c short circuit. In normal service, faults are imposed on rectifiers by both the arc-backs that occur in the rectifier itself and the short circuits that occur in the external d-c system.
C. C. Herskind, H. L. Kellogg
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Multicell Fault Current Limiter

IEEE Transactions on Industrial Electronics, 2014
A multicell fault current limiter (MCFCL) is proposed in this paper. The MCFCL is composed of multiple fault current limiting cells. Each fault current limiting cell consists of a fault current limiting inductor and a power electronic module. The proposed MCFCL has the flexibility in expanding the operation voltage by increasing the number of fault ...
Wenyong Guo   +6 more
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Nonsuperconducting Fault Current Limiter With Controlling the Magnitudes of Fault Currents

IEEE Transactions on Power Electronics, 2009
In this paper, a diode-bridge-type nonsuperconductor fault current limiter (NSFCL) is proposed. The structure has the capability of controlling the DC reactor current that yields to control the magnitude of fault current. In order to control the magnitude of DC reactor current, a discharging resistor is used in the proposed structure.
M.T. Hagh, M. Abapour
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Fault-Current Measuring Device

Transactions of the American Institute of Electrical Engineers, 1946
IN electric power system operation numerous problems are encountered in analyzing the results of short circuits and in the physical location of the trouble. Some devices now available for analyzing short circuits in a-c circuits are the oscillograph, the annunciator ammeter, and a magnetic link device requiring rectifiers.
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Fault Location with Current Monitoring

1991, Proceedings. International Test Conference, 2005
Recently there has been renewed interest in fault detection in static CMOS circuits through current monitoring (“Iddq testing”). It is shown that accurate defect (diagnosis miay be performed with a combination of current and voltage observations. The proposed system combines a simple single fault model for test generation with a more realistic multiple
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IGBT Fault Current Limiting Circuit

IEEE Industry Applications Magazine, 1995
Circuits are proposed which, by limiting the fault current magnitude, extends the short-circuit withstand time of high-efficiency (high-gain) IGBTs (insulated-gate bipolar transistors). Limiting of the fault current magnitude also results in reduced turn-off voltage transients, a desirable byproduct, especially for higher current modules. Moreover, the
R. Chokhawala, G. Castino
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Fault-resistance effect on ground fault current

Electrical Engineering, 1953
GROUND FAULT currents may be reduced substantially when fault resistance is included in the fault circuit. The majority of faults that occur on a power system involve ground and occur between conductor and tower. When a fault occurs to a steel tower or grounded wood pole on a grounded system the footing resistance is included automatically in the fault
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