Fault Detection Method based on Artificial Neural Network for 330kV Nigerian Transmission Line
International Journal of Innovative Science and Research TechnologyThis research focused on identifying various types of faults occurring on 330kV transmission lines through the use of artificial neural networks (ANN).
Alhassan Musa Oruma +5 more
semanticscholar +1 more source
A Review of Fault Detection and Diagnosis for the Traction System in High-Speed Trains
IEEE transactions on intelligent transportation systems (Print), 2020High-speed trains have become one of the most important and advanced branches of intelligent transportation, of which the reliability and safety are still not mature enough for keeping up with other aspects.
Hongtian Chen, B. Jiang
semanticscholar +1 more source
Fault Detection for Fuzzy Semi-Markov Jump Systems Based on Interval Type-2 Fuzzy Approach
IEEE transactions on fuzzy systems, 2020This article studies the fault detection problem for continuous-time fuzzy semi-Markov jump systems (FSMJSs) by employing an interval type-2 (IT2) fuzzy approach.
Linchuang Zhang +3 more
semanticscholar +1 more source
Series DC Arc Fault Detection Based on Ensemble Machine Learning
IEEE transactions on power electronics, 2020Series dc arc fault creates a fire hazard and negative impacts on the distribution bus if not detected and isolated quickly. However, the detection of a series arc fault is challenging due to the low fault current, lack of zero-crossing, and the erratic ...
Vu Le, Xiu Yao, Chad Miller, B. Tsao
semanticscholar +1 more source
Fault Detection Filter and Controller Co-Design for Unmanned Surface Vehicles Under DoS Attacks
IEEE transactions on intelligent transportation systems (Print), 2020This paper addresses the co-design problem of a fault detection filter and controller for a networked-based unmanned surface vehicle (USV) system subject to communication delays, external disturbance, faults, and aperiodic denial-of-service (DoS) jamming
Yong Ma +5 more
semanticscholar +1 more source
Distributed Fault Detection and Isolation for Multiagent Systems: An Interval Observer Approach
IEEE Transactions on Systems, Man, and Cybernetics: Systems, 2020This paper presents a distributed method for detecting and isolating the faults in multiagent systems (MASs). First, for the output-feedback-based closed-loop MAS in normal case and faulty cases, a bank of fault detection and isolation (FDI) interval ...
Zhi-Hui Zhang, Guang‐Hong Yang
semanticscholar +1 more source
Intelligent Fault Detection Scheme for Microgrids With Wavelet-Based Deep Neural Networks
IEEE Transactions on Smart Grid, 2019Fault detection is essential in microgrid control and operation, as it enables the system to perform fast fault isolation and recovery. The adoption of inverter-interfaced distributed generation in microgrids makes traditional fault detection schemes ...
J. Yu +3 more
semanticscholar +1 more source
Novel Fault Detection and Localization Algorithm for Low-Voltage DC Microgrid
IEEE Transactions on Industrial Informatics, 2020Accurate estimation of fault location is highly crucial for swift maintenance and early power restoration. Since faults in dc networks are time critical, this article proposes a new fault detection and localization scheme for a low-voltage direct current
Reddipalli Bhargav +2 more
semanticscholar +1 more source
A Deep Adversarial Transfer Learning Network for Machinery Emerging Fault Detection
IEEE Sensors Journal, 2020Deep transfer learning has attracted many attentions in machine intelligent fault diagnosis. However, most existed deep transfer learning algorithms encounter difficulties to detect a new emerging fault in target domain because these methods assume that ...
Jipu Li +5 more
semanticscholar +1 more source
Data-Driven Approach for Fault Detection and Diagnostic in Semiconductor Manufacturing
IEEE Transactions on Automation Science and Engineering, 2020Fault detection and classification (FDC) is important for semiconductor manufacturing to monitor equipment’s condition and examine the potential cause of the fault. Each equipment in the semiconductor manufacturing process is often accompanied by a large
Shu-Kai S. Fan +4 more
semanticscholar +1 more source