Results 191 to 200 of about 788,688 (243)
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IEEE Expert, 1991
The intelligent process control system (IPCS), an integrated environment for developing complex process control and automation systems is discussed, focusing on its real-time fault diagnostics capability. IPCS has been used to build a supervisory monitoring and diagnostics system for a cogenerator plant.
Samir Padalkar +5 more
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The intelligent process control system (IPCS), an integrated environment for developing complex process control and automation systems is discussed, focusing on its real-time fault diagnostics capability. IPCS has been used to build a supervisory monitoring and diagnostics system for a cogenerator plant.
Samir Padalkar +5 more
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Fault diagnostics and fault tolerant control
IEEE Transactions on Aerospace and Electronic Systems, 1998A novel simultaneous fault detection and diagnostics (FDD) and fault tolerant control (FTC) strategy for nonlinear stochastic systems in closed loops based on a continuous stirred tank reactor (CSTR) is presented. The purpose of control is to track the reactant concentration setpoint.
D.H. Zhou, P.M. Frank
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A diagnostic fault simulator for fast diagnosis of bridge faults
Proceedings Twelfth International Conference on VLSI Design. (Cat. No.PR00013), 1999A new diagnostic fault simulator is described that diagnoses both feedback and non-feedback bridge faults while using information from fault simulation of single stuck-at faults. A realistic fault model is used which considers the existence of the Byzantine Generals Problem. The approach has been demonstrated for two-line bridge faults on several large
Jue Wu, Elizabeth M. Rudnick
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Diagnostic Test Generation for Arbitrary Faults
2006 IEEE International Test Conference, 2006It is now generally accepted that the stuck-at fault model is no longer sufficient for many manufacturing test activities. Consequently, diagnostic test pattern generation based solely on distinguishing stuck-at faults is unlikely to achieve the resolution required for emerging fault types.
Naresh K. Bhatti, Ronald D. Blanton
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Fault isolation in an integrated diagnostic environment
IEEE Design & Test of Computers, 1993The use of information flow models to conduct efficient fault isolation strategies is described. Of particular concern is optimizing diagnosis to minimize some objective cost function. A technique that can include multiple cost criteria such as test time, skill level, and failure frequency, as well as information value, is discussed. >
William R. Simpson, John W. Sheppard
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Gaining diagnostic information for fault isolation
2013 IEEE International Conference on Information and Automation (ICIA), 2013Robots in dynamic and uncertain environments are vulnerable to mission failures due to external perturbation or internal malfunctions. Diagnosis is the process to detect, locate or even assess the fault. Since robots rely on their function modules to sense the external environment, it is difficult to locate the fault under uncertainties of robot ...
Jun Tang +5 more
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Diagnostic Fault Simulation of Sequential Circuits
Proceedings International Test Conference 1992, 2005In this work we describe a diagnostic fault simulator for sequential circuits which evaluates the effectiveness of a given test set in distinguishing between faults. Diagnostic fault simulation is performed on several ISCAS89 sequential benchmark circuits using two diferent deterministic test sets for each circuit.
Elizabeth M. Rudnick +2 more
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Characterization of probabilistic faults diagnostic models
2006 International Conference on Information Technology: Research and Education, 2006This paper suggests a characterization of probability-based search models describing various fault diagnostics processes, which are widely used in the current practice of complex computer systems and networks systems maintenance and service. The characterization is performed in terms of some tuples including: characteristics of fault models ...
Sergey Frenkel +2 more
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A novel approach to fault diagnostics and prognostics
2003 IEEE International Conference on Robotics and Automation (Cat. No.03CH37422), 2004A novel fault diagnostics and prognostics algorithm based on hidden Markov model (HMM) is proposed. The algorithm combines fault diagnostics and prognostics in a unified framework. The algorithm has been fully tested by using experimental data from a rotating shift testbed in our laboratory.
Chiman Kwan +3 more
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Experiences with concurrent fault simulation of diagnostic programs
International Test Conference 1988 Proceeding@m_New Frontiers in Testing, 1990A methodology is presented for fault-simulation of system level diagnostic programs involving large models (50000 to 200000 gates) and long test sequences. Accuracy of memory models, interplay of target faults with diagnostic program development, and creation of shorter diagnostics are topics covered.
Stephen R. Demba +3 more
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