Results 281 to 290 of about 675,095 (343)

Secondary electron field emission

Physica Status Solidi (a), 1988
Secondary electron field emission (SEFE) is based on Fowler-Nordheim tunneling from conducting substrates into thin insulating layers due to their strongly positive charging-up during electron bombardment. This self-consistent charging-up process is demonstrated by a computer simulation.
H.-J. Fitting, D. Hecht
openaire   +1 more source

Design of field electron emission spectrometer, field ion microscope, and field electron emission microscope combination

SPIE Proceedings, 1994
A new set up is described which allows one to carry out field electron microscopic and spectroscopic study of cathode surfaces in direct correlation with their atomic structure.
S. N. Ivanov   +2 more
openaire   +1 more source

Electron field emission source

4th IEEE International Conference on Vacuum Electronics, 2003, 2004
In this paper the new design of the electron field emission source for surface analyzers, displays, X-ray tubes and microwave devices is proposed. The advantages of the field emission source are also provided. Several variants of the field emission sources have been produced and tested.
S.V. Barsov   +6 more
openaire   +1 more source

A Field Emission Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America, 1971
We have developed a field emission electron microscope. Although field emission gun requires ultra high vacuum and skillful technique, it brings about the favorable characteristics of high brightness and small energy spread. This characteristics will enable a significant progress in coherent electron optics and high resolution electron microscopy ...
A. Tonomura, T. Komoda
openaire   +1 more source

Field electron emission from nanodiamond

Technical Physics Letters, 2009
Nanodiamond (ND) films on silicon substrates have been synthesized by plasmachemical deposition (PCD). Films with minimum differences in the structure and morphology, which were obtained by varying the PCD process parameters, exhibited significantly (several orders in magnitude) different field-emission currents.
S. A. Lyashenko   +3 more
openaire   +1 more source

Field emission of cold electrons

Technical Physics, 2006
A mathematical model of tunnel current from the metal surface is proposed for the case when atomic particles colliding with the surface cause electronic excitation of the solid.
A. V. Razin, V. F. Kharlamov
openaire   +1 more source

Field Emission Analytical Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America, 1976
Recently, analytical electron microscopes (AEM), which provide the functions of the transmission electron microscope (TEM), scanning electron microscope (SEM) and energy dispersive X-ray spectrometer (EDS) have been put to practical use with a view to analyzing elements in micro areas, xo improve the performance of this type of AEM, a field emission ...
Y. Harada   +5 more
openaire   +1 more source

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