Results 251 to 260 of about 171,918 (304)

Six-month evaluation of normal mouse brain side effects: Comparing FLASH and conventional proton partial brain irradiation. [PDF]

Clin Transl Radiat Oncol
Bernabei M, Nexhipi S, Bodenstein E, Horst F, Lühr A, Pawelke J, Schneider M, Schürer M, Schwarz R, Dietrich A, Beyreuther E.   +10 more
europepmc   +1 more source

Predictive modeling of influenza strain drugs using temperature-based topological indices and regression analysis via multi-criteria decision making techniques. [PDF]

Sci Rep
Hayat H, Ahmad S, Siddiqui MK, Petros FB.   +3 more
europepmc   +1 more source

Rational Formulation of Ether-Lactone Electrolytes for Safe and Sustainable Ni-Rich Lithium-Ion Batteries. [PDF]

Angew Chem Int Ed Engl
Gómez-Urbano JL, Binder M, Dwiputra EN, Diemant T, Bresser D, Pierini A, Cioffi A, Bodo E, Brutti S, Koželj M, Gouveia T, Bremond E, Ladam A, Fantini S, Sananes-Israel S, Landa-Medrano I, de Meatza I, Balducci A.   +17 more
europepmc   +1 more source

High-speed single-electron memory: cell design and architecture

, 1998
Mizuta, Hiroshi, Nakazato, K., Williams, D., Katayama, K., Muller, H. -O., Ahmed, H.   +5 more
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Flash Temperature in Clutches

SAE Technical Paper Series, 2005
<div class="htmlview paragraph">Sliding contact between friction surfaces occurs in numerous torque transfer elements: torque converter clutches, shifting clutches, launch or starting clutches, limited slip differential clutches, and in the meshing of gear teeth under load.
T. M. Cameron, T. McCombs, S. Tersigni, T.-C. Jao   +3 more
openaire   +1 more source

Temperature dependence of TIQ flash ADC

Materials Today: Proceedings, 2023
Abstract Threshold Inverter Quantizer (TIQ) is an innovative idea in the construction of flash ADC, which can effectively replace the reference voltage circuit, resistive or capacitive voltage divider and differential comparator array in a conventional flash ADC by an internal reference comparator array made of CMOS inverters.
George M. Joseph, T.A. Shahul Hameed
openaire   +1 more source

Low temperature endurance failures on flash memory

2017 18th International Symposium on Quality Electronic Design (ISQED), 2017
Write-erase cycling of flash memories has distinct failure signatures that have been thoroughly documented in the literature. A new mechanism has been uncovered when cycling at low temperatures. On the 65nm embedded flash technology, units exhibited a programming failure signature.
Stephen K. Heinrich-Barna, Clyde Dunn, Doug Verret   +2 more
openaire   +1 more source

The flash temperature concept

Wear, 1963
Abstract A survey is given of the history of the flash temperature concept and of the importance it has increasingly gained in the lubrication and design of rubbing components that are prone to scuffing, such as highly loaded gear teeth and cams and tappets.
openaire   +1 more source

Flash Temperature on the Asperity Scale and Scuffing

Journal of Tribology, 1988
A simulation model is described for determining the distribution of asperity flash temperatures when rough surfaces undergo relative sliding. The asperities are assumed to deform elastically and to have coulomb friction at their tips. The spherical asperity model of Greenwood-Williamson is joined with the flash temperature approximation formulas ...
J. I. McCool, J. John
openaire   +1 more source

Estimation of flash point temperature

Journal of Chemical Education, 1973
A simple technique for determining the approximate flash point temperature of a compound, knowing only its atomic composition and boiling point, has been developed from experimental data and some theoretical considerations.
openaire   +1 more source