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Light and focused ion beam microscopy workflow for resin-embedded tissues [PDF]
Frontiers in Cell and Developmental Biology, 2023 Although the automated image acquisition with the focused ion beam scanning electron microscope (FIB-SEM) provides volume reconstructions, volume analysis of large samples remains challenging.
Horacio Merchant-Larios +3 more
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Focused-ion-beam processing for photonics [PDF]
2007 9th International Conference on Transparent Optical Networks, 2007 Although focused ion beam (FIB) processing is a well-developed technology for many applications in electronics and physics, it has found limited application to photonics.
Ay, Feridun +2 more
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Deep-Learning-Assisted Focused Ion Beam Nanofabrication. [PDF]
Nano Lett, 2022 Focused ion beam (FIB) milling is an important rapid prototyping tool for micro- and nanofabrication and device and materials characterization. It allows for the manufacturing of arbitrary structures in a wide variety of materials, but establishing the process parameters for a given task is a multidimensional optimization challenge, usually addressed ...
Buchnev O +5 more
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Investigation of the Shadow Effect in Focused Ion Beam Induced Deposition [PDF]
Nanomaterials, 2022 Due to the precursor gas flow in the focused ion beam induced deposition process, a shadow effect appears behind the shading structures. This article carries out experiments with phenanthrene as the precursor gas and establishes a numerical model to ...
Chen Fang, Yan Xing
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Focused ion beam-induced platinum deposition with a low-temperature cesium ion source [PDF]
Beilstein Journal of NanotechnologyIn addition to precise milling, the deposition of material at a specific location on a sample surface is a frequently used process of focused ion beam (FIB) systems.
Thomas Henning Loeber +5 more
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Focused Ion Beam Microfabrication [PDF]
SPIE Proceedings, 1988 Contains an introduction, reports on seven research projects and a list of publications.Defense Advanced Research Projects Agency/U.S. Army Research Office Contract DAAL03-88-K-0108National Science Foundation Grant ECS 89-21728U.S.
Antoniadis, Dimitri A. +22 more
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Morphological evolution of silicon surfaces nanopatterned by focused ion beam irradiation [PDF]
Scientific ReportsNanopatterning on solid surface has emerged as an important tool in the field of nanotechnology, nano/micro-electromechanical systems (NEMS/MEMS), photonics, and biotechnology. Among the available techniques, focused ion beam (FIB) enables controlled and
Dipak Bhowmik
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Review of Recent Advances in Gas-Assisted Focused Ion Beam Time-of-Flight Secondary Ion Mass Spectrometry (FIB-TOF-SIMS). [PDF]
Materials (Basel), 2023 Priebe A, Michler J.
europepmc +3 more sources
Superconducting Materials and Devices Grown by Focused Ion and Electron Beam Induced Deposition
Nanomaterials, 2022 Since its discovery in 1911, superconductivity has represented an equally inciting and fascinating field of study in several areas of physics and materials science, ranging from its most fundamental theoretical understanding, to its practical application
Pablo Orús +3 more
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Materials for Quantum Technology, 2023 In this Perspective article, we evaluate the current state of research on the use of focused electron and ion beams to directly fabricate nanoscale superconducting devices with application in quantum technologies.
José María De Teresa
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