Results 161 to 170 of about 272,969 (345)

Introducing an Inclination Angle and Surface Topography to the Interaction Mechanism between Focused Ion Beam and Solids

, 2023
Zhen He, Jun Dai, Yu Sun, Yonghua Zhao, Reo Kometani   +4 more
openalex   +1 more source

Crack‐Growing Interlayer Design for Deep Crack Propagation and Ultrahigh Sensitivity Strain Sensing

Advanced Functional Materials, EarlyView.
A crack‐growing semi‐cured polyimide interlayer enabling deep cracks for ultrahigh sensitivity in low‐strain regimes is presented. The sensor achieves a gauge factor of 100 000 at 2% strain and detects subtle deformations such as nasal breathing, highlighting potential for minimally obstructive biomedical and micromechanical sensing applications ...
Minho Kim, Taewi Kim, Jieun Park, Insic Hong, Myungrae Hong, Seonggyeong Park, Beomjin Kim, Sehyuk Ahn, Siwoo Jang, Seungyong Han, Je‐Sung Koh, Daeshik Kang   +11 more
wiley   +1 more source

Unmasking the Resolution-Throughput Tradespace of Focused-Ion-Beam Machining. [PDF]

Adv Funct Mater, 2022
Madison AC, Villarrubia JS, Liao KT, Copeland CR, Schumacher J, Siebein K, Ilic BR, Liddle JA, Stavis SM.   +8 more
europepmc   +1 more source

Drift Compression and Final Focus for Intense Heavy Ion Beams with Non-periodic, Time-dependent Lattice

, 2005
Hong Qin, Ronald C. Davidson, J.J. Barnard, Edward P. Lee   +3 more
openalex   +2 more sources

Gas-assisted focused electron beam and ion beam processing and fabrication [PDF]

, 2008
Ivo Utke, P. Hoffmann, J. Melngailis
openalex   +1 more source

Magnetic and Structural Response Tuned by Coexisting Mn Concentration‐Dependent Phases in MnBi2Te4 Thin Film Grown on GaAs(001) by Molecular Beam Epitaxy

Advanced Functional Materials, EarlyView.
The study explores structural and magnetic properties of one of the most recent topological quantum materials (MnBi2Te4). The Mn‐poor structure leads to stacking faults (quintuple layer ‐ QL of Bi2Te3 formation instead of a septuple layer ‐ SL of MnBi2Te4), resulting in a coexistence between weak antiferromagnetism and ferromagnetism.
Wesley F. Inoch, Sergio L. A. Mello, Gilberto Rodrigues‐Junior, Sukarno O. Ferreira, Marcelo M. Sant'Anna, Benjamin R. Salles, Mateus T. Souza, Sérgio L. Morelhão, Maybi F. Sampaio, Bráulio S. Archanjo, Leonarde N. Rodrigues   +10 more
wiley   +1 more source

Focused Ion Beams. Nanofabrication by Focused Ion Beams.

Hyomen Kagaku, 1995
openaire   +2 more sources

In Situ Study of Resistive Switching in a Nitride‐Based Memristive Device

Advanced Functional Materials, EarlyView.
In situ TEM biasing experiment demonstrates the volatile I‐V characteristic of MIM lamella device. In situ STEM‐EELS Ti L2/L3 ratio maps provide direct evidence of the oxygen vacancies migrations under positive/negative electrical bias, which is critical for revealing the RS mechanism for the MIM lamella device.
Di Zhang, Rohan Dhall, Matthew M. Schneider, Cun Li, Chengyu Song, Sundar Kunwar, Hongyi Dou, Natanii R. Yazzie, Henry Tran, Daniel Appuing, Jim Ciston, Nicholas G. Cucciniello, Pinku Roy, Michael T. Pettes, John Watt, Winson Kuo, Haiyan Wang, Ye Cao, Rodney J. McCabe, Aiping Chen   +19 more
wiley   +1 more source

Exploring the influence of focused ion beam processing and scanning electron microscopy imaging on solid-state electrolytes. [PDF]

Microscopy (Oxf), 2023
Ding Z, Tang Y, Chakravadhanula VSK, Ma Q, Tietz F, Dai Y, Scherer T, Kübel C.   +7 more
europepmc   +1 more source

Plan view TEM sample preparation using the focused ion beam lift-out technique [PDF]

, 1998
F. A. Stevie, R. B. Irwin, T. L. Shofner, S. R. Brown, J. L. Drown, Lucille A. Giannuzzi   +5 more
openalex   +1 more source