Results 11 to 20 of about 272,969 (345)
Effects of Focused Ion Beam Lithography on La2−xSrxCuO4 Single Crystals
Focused ion beam (FIB) milling is a mask-free lithography technique that allows the precise shaping of 3D materials on the micron and sub-micron scale. The recent discovery of electronic nematicity in La2−xSrxCuO4 (LSCO) thin films triggered the search ...
Roberta Caruso +7 more
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Direct magneto-optical compression of an effusive atomic beam for high-resolution focused ion beam application [PDF]
An atomic rubidium beam formed in a 70 mm long two-dimensional magneto-optical trap (2D MOT), directly loaded from a collimated Knudsen source, is analyzed using laser-induced fluorescence.
de Raadt, T. C. H. +6 more
core +7 more sources
Use of PtC Nanotips for Low-Voltage Quantum Tunneling Applications
The use of focused ion and focused electron beam (FIB/FEB) technology permits the fabrication of micro- and nanometer scale geometries. Therefore, FIB/FEB technology is a favorable technique for preparing TEM lamellae, nanocontacts, or nanowires and ...
Michael Haub +3 more
doaj +1 more source
To realize quantum tunneling applications with movable electrodes, sharp tips with radii down to several tens of nanometers are necessary. The use of a focused ion beam (FIB) and focused electron beam (FEB) with a gas injection system (GIS) allows the ...
Michael Haub +3 more
doaj +1 more source
Focused ion beams in biology [PDF]
A quiet revolution is under way in technologies used for nanoscale cellular imaging. Focused ion beams, previously restricted to the materials sciences and semiconductor fields, are rapidly becoming powerful tools for ultrastructural imaging of biological samples.
Kedar, Narayan, Sriram, Subramaniam
openaire +2 more sources
The helium ion microscope has emerged as a multifaceted instrument enabling a broad range of applications beyond imaging in which the finely focused helium ion beam is used for a variety of defect engineering, ion implantation, and nanofabrication tasks.
Frances I. Allen
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Material Sputtering with a Multi-Ion Species Plasma Focused Ion Beam
Focused ion beams are an essential tool for cross-sectional material analysis at the microscale, preparing TEM samples, and much more. New plasma ion sources allow for higher beam currents and options to use unconventional ion species, resulting in ...
Valerie Brogden +6 more
doaj +1 more source
Measurement and Simulation of Ultra-Low-Energy Ion–Solid Interaction Dynamics
Ion implantation is a key capability for the semiconductor industry. As devices shrink, novel materials enter the manufacturing line, and quantum technologies transition to being more mainstream.
Michael Titze +7 more
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Focused Ion Beam Processing for 3D Chiral Photonics Nanostructures
The focused ion beam (FIB) is a powerful piece of technology which has enabled scientific and technological advances in the realization and study of micro- and nano-systems in many research areas, such as nanotechnology, material science, and the ...
Mariachiara Manoccio +4 more
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Editorial for the Special Issue on Nanofabrication with Focused Electron/Ion Beam Induced Processing
Focused electron beam (FEB) and focused ion beam (FIB) technologies have opened novel paths for material science research and technology at the micro and nano scales in recent decades [...]
Rosa Córdoba
doaj +1 more source

