Results 51 to 60 of about 272,969 (345)
Focused Ion Beam Fabrication [PDF]
, 1987 Contains reports on five research projects.DARPA/Naval Electronic Systems Command (Contract MDA-903-85-C-0215)Charles Stark Draper Laboratory (Contract DL-H-261827)U.S.
Antoniadis, Dimitri A. +11 more
core
Focused ion beam milling strategy for sub-micrometre holes in silicon [PDF]
, 2008 Focused ion beam (FIB) milling can be used as a tool to fabricate structures with sub-micrometer details. The slab material can be silicon, for example, which can then be used as a mould for nano-imprint lithography, or in silicon on insulator (SOI ...
Ay, Feridun +2 more
core +2 more sources
Dynamic Precipitation during High‐Pressure Torsion of a Magnesium–Manganese Alloy
Advanced Engineering Materials, EarlyView.An ultrafine‐grained alloy is produced by high‐pressure torsion of solutionized Mg–1.35 wt% Mn. Precipitation of nanometer‐scale Mn particles during deformation provides pinning sites. This prevents the formation of a bimodal grain structure and results in a finer grain size than for pure Mg.
Julian M. Rosalie, Anton Hohenwarter
wiley +1 more source
Materials Today, 2007 The focused ion beam (FIB) system is an important tool for understanding and manipulating the structure of materials at the nanoscale. Combining this system with an electron beam creates a DualBeam - a single system that can function as an imaging, analytical and sample modification tool.
openaire +2 more sources
Focused ion beam treatment of ZnO nanowires
Moldavian Journal of the Physical Sciences, 2009 We investigated vapour-liquid-solid (VLS)-grown ZnO nanowires (NWs) on a Si sub- strate by scanning electron microscopy (SEM). Nanowires are found in a variety of shapes, surface properties and features, but seem to be all homogeneous inside.
Shmavonyan, G.
doaj
Comparison of Plasmonic Arrays of Holes Recorded by Interference Lithography and Focused Ion Beam
IEEE Photonics Journal, 2012 In this paper, we compare the geometric characteristics and the optical properties of plasmonic hole arrays recorded in gold (Au) films using two different techniques, namely, focused ion beam (FIB) and interference lithography (IL).
J. W. Menezes +4 more
doaj +1 more source
Focused-ion-beam fabrication of slots in silicon waveguides and ring resonators [PDF]
, 2008 We present the focused-ion-beam fabrication of slots in silicon waveguides and racetrack resonators. The silicon waveguides and resonators were pre-fabricated without slot with deep-UV lithography.
Baets, Roel +3 more
core +2 more sources
Advanced Engineering Materials, EarlyView.Freeze‐drying of layered silicate is the key to get coatings with superior gas barrier. Freeze‐drying of layered silicates modified with dodecylamine (DDA) is a highly effective technique for the preparation of barrier pigments that significantly mitigate the permeation of oxygen, water vapor, and hydrogen through polymer films containing these ...
Joshua Lommes +4 more
wiley +1 more source
System for Measuring Emittance Characteristics of Ion Sources
East European Journal of Physics, 2020 To determine the emittance characteristics of the ion sources, a measurement system has been developed using an electrostatic scanner scheme. The article presents the results of testing system performance.
Vitalii I. Voznyi +5 more
doaj +1 more source
U-shaped bilayer graphene channel transistor with very high Ion/Ioff ratio
, 2011 A novel graphene transistor architecture is reported. The transistor has a U-shaped geometry and was fabricated using a gallium focused ion beam (FIB). The channel conductance was tuned with a back gate.
Boden, Stuart +4 more
core +1 more source