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Reflection Spectroscopy With The FT-IR Microscope
SPIE Proceedings, 1989The FT-IR microscope is a versatile sampling accessory used to record IR spectra in either transmittance or reflectance modes and capable of obtaining data from microscopic sampling areas. Because the FT-IR microscope simplifies the collection of reflectance data it has renewed interest in reflectance spectroscopy.
William T. Wihlborg +3 more
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PVC plastisols decomposition by FT-IR spectroscopy
European Polymer Journal, 1997A specially designed cell, as described in previous papers, has been used to study the dynamic in situ decomposition of PVC plastisols by FT-IR. The FT-IR spectra provides a new point of view into the intricate problem of the effect of the plasticizers (compatibility and concentration) in the PVC decomposition.
M. Beltrán, A. Marcilla
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Comparison of FT-IR and Raman Spectroscopy
1980Paralleling the evolution of Fourier Transform Infrared Spectroscopy during the 1960’s and 1970’s there have been rapid developments in the area of Raman spectroscopy. The laser serves only in a secondary role for FT-IR spectroscopy, but as a source for excitation it has greatly revolutionized conventional Raman spectroscopy and led to the advent of ...
W. Kiefer, J. Laane
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Depth Profiling by FT-IR Photoacoustic Spectroscopy
1997Adding photoacoustic phase data to photoacoustic magnitude data allows for more complete and more quantitative depth profiling of samples with depth dependent composition. Phase modulation is used here to quantitatively measure layer depths in discretely layered samples.
John F. McClelland +3 more
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Banknote Characterization using FT-IR Spectroscopy
2017Counterfeit methods are more sophisticated than ever before, so it is necessary to implement as many different methods as possible to get reliable information on the origin of the banknotes. FTIR spectroscopy provides exactly this, a different approach to the identification of different banknote components, from the paper itself, to the ...
Modrić, Damir, Itrić Ivanda, Katarina
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FT-IR and Raman Spectroscopy of C58BN
1997The standard electric arc generator was used to prepare fullerenes substitutionally doped on the surface with boron and nitrogen. The material is a unique case of a molecular crystal of high symmetry, consisting of molecules of extremely low C s symmetry. FT-IR and FT-Raman spectra of the C58BN were measured in the spectral region 2000™30 cm™1 and over
K. Antonova +4 more
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