Results 231 to 240 of about 223,887 (275)
Some of the next articles are maybe not open access.
Full depletion voltage and separation voltage for a double-sided microstrip detector
2015???????????????????????? ???????????????????? ?????????????????????? ?????????????? ?????????????? ?????????????????? ?? ?????????????? ????????????????????. ????????????????, ???? ???? ?????????????? ???? ???????????? ?????????? ???????????????? ?????? ?? ??????????????????. ?????????????????????????? ?????????????????? ?????????? ??????????.
Maslov, N., Starodubtsev, O.
openaire +1 more source
Low-solvation electrolytes for high-voltage sodium-ion batteries
Nature Energy, 2022Yan Jin +15 more
semanticscholar +1 more source
Journal of Computational Electronics, 2015
P. Pandey, R. Vishnoi, M. J. Kumar
semanticscholar +2 more sources
P. Pandey, R. Vishnoi, M. J. Kumar
semanticscholar +2 more sources
Non-full depletion mode and its experimental realization of the lateral superjunction
International Symposium on Power Semiconductor Devices and IC's, 2018Wentong Zhang +11 more
semanticscholar +1 more source
ACS Nano
Ester-based electrolytes, known for their cost-effectiveness and wide voltage windows, face compatibility challenges with lithium metal (Li0), leading to irreversible decomposition and dendrite growth, which impede their application in high-energy ...
Baogang Zhao +16 more
semanticscholar +1 more source
Ester-based electrolytes, known for their cost-effectiveness and wide voltage windows, face compatibility challenges with lithium metal (Li0), leading to irreversible decomposition and dendrite growth, which impede their application in high-energy ...
Baogang Zhao +16 more
semanticscholar +1 more source
1-V Full-Swing Depletion-Load a-In–Ga–Zn–O Inverters for Back-End-of-Line Compatible 3D Integration
IEEE Electron Device Letters, 2016Li-Jen Chi +3 more
semanticscholar +1 more source
E-Mode p-GaN Gate Punch-Through HEMT with Robust Non-Destructive Drain Breakdown
International Electron Devices MeetingThis work presents an E-mode p-GaN gate punch-through HEMT (PT-HEMT) which could achieve repetitive non-destructive breakdown, addressing the long-standing issue in conventional GaN HEMTs—the lack of avalanche robustness. The PT-HEMT features an array of
Jingjing Yu +9 more
semanticscholar +1 more source
2025 IEEE Nuclear Science Symposium (NSS), Medical Imaging Conference (MIC) and Room Temperature Semiconductor Detector Conference (RTSD)
We developed and evaluated a wide dynamic range readout circuit optimized for silicon sensors with large parasitic capacitance, using a single-channel configuration.
K. Yoda, T. Chujo, M. Inaba
semanticscholar +1 more source
We developed and evaluated a wide dynamic range readout circuit optimized for silicon sensors with large parasitic capacitance, using a single-channel configuration.
K. Yoda, T. Chujo, M. Inaba
semanticscholar +1 more source

