Results 231 to 240 of about 142,873 (289)
Operator-level quantum acceleration of non-logconcave sampling. [PDF]
Leng J, Ding Z, Chen Z, Lin L.
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A Low-Noise and High-Integration Readout IC with Pixel-Level Single-Ended CDS for Short-Wave Infrared Focal Plane Arrays. [PDF]
Wang H +7 more
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Predicting Transmural Lesion Formation and Steam-Pop Occurrence During Bipolar Ablation-Ex Vivo Porcine Model. [PDF]
Makimoto H +12 more
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Three Phase Dynamic Simulation of Air Blast Generator Circuit Breakers -- Theory and Modeling
IEEE Transactions on Power Apparatus and Systems / Technical Operations Committee, 1982Simulations of three-phase faults at the generator terminals have shown the existence of non-zero currents in all three phases for several cycles. Particularly in the application of generator circuit breakers, there could be a serious problem in that the delayed current-zero phenomenon might inhibit normal circuit opening.
N. R. Prasad, S. R. Herling
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Journal of Computational and Applied Mathematics, 2021
zbMATH Open Web Interface contents unavailable due to conflicting licenses.
Arzu Ahmadova, Nazim I. Mahmudov
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zbMATH Open Web Interface contents unavailable due to conflicting licenses.
Arzu Ahmadova, Nazim I. Mahmudov
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Cortical circuits and modules in movement generation: experiments and theories
Current Opinion in Neurobiology, 2016Here we review recent studies of the cortical circuits subserving the control of posture and movement. This topic is addressed from neurophysiological and evolutionary perspectives describing recent advancements achieved through experimental studies in humans and non-human primates.
Tamar, Flash, Emilio, Bizzi
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Test generation for combinational logic circuits using information theory
Computers & Electrical Engineering, 1986Abstract Application of probability and information theory to test pattern generation for combinational logic circuits is investigated. It is verified that choosing the input probability to maximize the output information reduced to a minimum the number of random patterns to be generated to detect all the faults in the circuit.
P.D. Stigall, Y.M. Erten
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A generalized theory of transistor bias circuits
Transactions of the American Institute of Electrical Engineers, Part I: Communication and Electronics, 1958ONE of the important problems met in the design of transistor circuits is how to arrange the bias network to obtain the proper operating point and how to maintain this condition within specified limits, subject to environmental changes such as temperature, or to a range of parameters due to production spread in device manufacture. Several bias circuits
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