Results 251 to 260 of about 418,007 (311)

Topological Weyl and Nodal Line Half-Metals in Two-Dimensional van der Waals Material EuOX (X = F, Cl, Br, I). [PDF]

Materials (Basel)
Hung SH, Jeng HT.
europepmc   +1 more source

Reasonable drilling angle and technology application for pre-cracking thick-hard roofs before driving gob-side roadways in ultra-thick seams. [PDF]

Sci Rep
He F, Wu Y, Wang D, Zhang J, Tao K.
europepmc   +1 more source

Multiscale insights into sodium storage in hard carbon from <i>operando</i> small- and wide-angle neutron scattering measurements. [PDF]

Chem Sci
Umemoto Y, Ohishi K, Igarashi D, Tatara R, Lin CA, Nakamoto K, Kawamura Y, Hiroi K, Takata SI, Nambu Y, Tateyama Y, Komaba S.   +11 more
europepmc   +1 more source

Characterisation of the axon initial segment and intrinsic excitability in the sub-acute phase post-ischaemic stroke. [PDF]

Brain Commun
King ES, Beros JL, Fujiyama H, Bindoff A, Reynolds JNJ, Tang AD.   +5 more
europepmc   +1 more source

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Determination of Half-Value Layer

Radiology, 1959
In the determination of half-value layer, the geometry involved is usually described as “good” geometry or “poor” geometry. In general, these terms have reference to measurements made under narrow-beam and broad-beam conditions. Such conditions have not been too well explored.
E D, TROUT, J P, KELLEY, A C, LUCAS
openaire   +3 more sources

On the measurement of half‐value layer in film–screen mammography

Medical Physics, 1990
Sources of variations in the measurement of half‐value layer (HVL) in film–screen mammography are evaluated. Two principal sources are the energy responses of ionization chambers and the elemental compositions of the 1100 aluminum‐alloy attenuation materials.
L K, Wagner, B R, Archer, F, Cerra
openaire   +2 more sources

Uncertainties in half value layer determination in mammography

AIP Conference Proceedings, 2016
A critical analysis of the methodologies for evaluating the x-ray half value layer was conducted. Experimental data were fitted by using MATLAB curve fitting toolbox, to an exponential function. Half value layer and its uncertainties were determined directly from the parameter of the fitted function.
S. Mijović, S. Ivanović, F. Bemelmans, H. Bosmans   +3 more
openaire   +1 more source