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Windowed Mean Drift Exponentially Weighted Moving Average Control Chart for Monitoring Complex Autocorrelated Processes

open access: yesQuality and Reliability Engineering International, EarlyView.
ABSTRACT In modern manufacturing environments, traditional statistical process control (SPC) methods often struggle with complex, dynamic data patterns, particularly when observations are autocorrelated. Control charts are useful tools used in SPC to detect any significant drift in a process.
Jeanette Maria Louw   +3 more
wiley   +1 more source
Some of the next articles are maybe not open access.

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