Results 1 to 10 of about 72,792 (298)
A Novel DTSCR Structure with High Holding Voltage and Enhanced Current Discharge Capability for 28 nm CMOS Technology ESD Protection [PDF]
To cope with the much narrower ESD design window in 28 nm CMOS technology, a novel diode-triggered silicon-controlled rectifier with an extra discharge path (EDP-DTSCR) for ESD protection is proposed in this paper.
Zeen Han +6 more
doaj +3 more sources
Novel High Holding Voltage SCR with Embedded Carrier Recombination Structure for Latch-up Immune and Robust ESD Protection [PDF]
A novel CMOS-process-compatible high-holding voltage silicon-controlled rectifier (HHV-SCR) for electrostatic discharge (ESD) protection is proposed and demonstrated by simulation and transmission line pulse (TLP) testing.
Zhuo Wang +5 more
doaj +2 more sources
In this paper, we report a novel laterally actuated Radio Frequency (RF) Microelectromechanical Systems (MEMS) switch, which is based on a combination of electrothermal actuation and electrostatic latching hold.
Yong Zhu, Jitendra Pal
doaj +2 more sources
A New High Holding Voltage Dual-Direction SCR With Optimized Segmented Topology
While silicon controlled rectifiers (SCRs) are highly robust electrostatic discharge (ESD) protection devices, they typically are not suited for high-voltage ESD protection due to their inherently low holding voltage and thus vulnerability to latch-up ...
Xiaozong Huang +2 more
exaly +2 more sources
A New Dual-Direction SCR With High Holding Voltage and Low Dynamic Resistance for 5 V Application
Dual-directional silicon-controlled rectifiers (DDSCRs), which provide both positive and negative electrostatic discharge (ESD) surge paths, are ESD protection devices with an excellent area efficiency.
Kyoung-Il Do +2 more
exaly +3 more sources
In liquid crystal (LC) displays, deriving an optimum resistance level of an LC alignment polyimide (PI) layer is important because of the trade-off between the voltage holding and surface-discharging properties. In particular, to apply a power-saving low-
Jeong-Hoon Ko +4 more
doaj +2 more sources
Optimization of the drain-side configuration in ESD-protection SCR-LDMOS for high holding-voltage applications [PDF]
A conventional silicon-controlled rectifier integrated into a laterally diffused MOSFET (SCR-LDMOS) is studied through 2D TCAD simulations in order to obtain the maximum holding voltage without increasing the area consumption or degrading the power-to ...
Elena Gnani, S Reggiani, G Boselli
exaly +2 more sources
Recording and modeling of pinched hysteresis loops, the fingerprint of a memristor, in neurons [PDF]
A variant of the Hodgkin-Huxley model has been proposed in which time-varying Na+ and K+ ion conductances are replaced by memristors, based on the proposal that ion channels are memristors.
Oliver Pabst +5 more
doaj +2 more sources
In order to investigate the thawing time and water-holding capacity under high-voltage electric field (HVEF), we studied the thawing experiments of frozen beef in a multiple needles-to-plate electrode system.
Yaming Zhang +4 more
doaj +2 more sources
4H-SiC is a wide-bandgap material that exhibits excellent high-temperature conductivity and high operating voltage. These characteristics can provide high electrostatic discharge (ESD) robustness in high voltage applications. However, a considerably wide
Kyoung-Il Do +3 more
doaj +1 more source

