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On a Hybrid CNN-Driven Pipeline for 3D Defect Localisation in the Inspection of EV Battery Modules. [PDF]
Sensors (Basel)Catti P, Fabbro L, Nikolakis N.
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A field boundary dataset for the canadian prairies derived from sentinel-2 imagery using the segment anything model. [PDF]
Data BriefHa T +3 more
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Quality Technology and Quantitative Management, 2015
AbstractThis paper refers to the AOQL single sampling plans for the inspection by variables, when the remainder of the rejected lots is inspected. The exact calculation of AOQL plans for minimizing the mean inspection cost per lot of the process average quality, which has been implemented in contributed package for R computing environment, is ...
Nikola Kasprikova, Jindrich Klufa
exaly +2 more sources
AbstractThis paper refers to the AOQL single sampling plans for the inspection by variables, when the remainder of the rejected lots is inspected. The exact calculation of AOQL plans for minimizing the mean inspection cost per lot of the process average quality, which has been implemented in contributed package for R computing environment, is ...
Nikola Kasprikova, Jindrich Klufa
exaly +2 more sources
Compensating for Inspection Errors in Attribute Inspection
Quality Engineering, 1995Sampling plans developed for attribute inspection have been designed based on the assumption that inspection is error-free or constant. Studies have shown that inspection is not error-free and is systematically influenced by such factors as time availab..
Anand K. Gramopadhye +3 more
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Inspection Errors for Attributes in Quality Control
Technometrics, 1993Acceptance sampling.- Basic distributions: single sampling.- Basic distributions: multiple sampling.- Double and link sampling for acceptance.- Multitype nonconformities.- Identification of nonconforming items.- (Dorfman) group testing.- Dorfman-Sterrett group testing and its extensions.- Curtailed Dorfman-type procedures.- Graff and Roeloffs' approach
Richard R. Carlson +3 more
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Wald Sequential Sampling for Attribute Inspection
Journal of Quality Technology, 1984A BASIC program is presented that eliminates the need for lengthy manual calculations for attribute sequential sampling plans.
David R. Garrison, John J. Hickey
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