Results 131 to 140 of about 36,249 (243)

Measurements of source emittance and beam coherence properties of the upgraded Advanced Photon Source. [PDF]

J Synchrotron Radiat
Shi X, Lin YC, Zhao J, Toellner T, Hu MY, Seifert S, Lee B, Grizolli W, Wojcik MJ, Rebuffi L, Assoufid L, Sajaev V.   +11 more
europepmc   +1 more source

Ultrabroadband air-dielectric double-chirped mirrors for laser frequency combs. [PDF]

Light Sci Appl
Zeng T, Dikmelik Y, Xie F, Lascola K, Burghoff D, Hu Q.   +5 more
europepmc   +1 more source

Measurement of large discontinuities using single white light interferogram white light interferogram

, 2014
White light interferometry is a widely used tool to extend the unambiguous measurement range of a monochromatic interferometer. In this work, we discuss Hilbert transformation analysis of a single white light interferogram acquired with a single-chip color CCD camera for step height measurement which lies beyond the unambiguous range of the ...
Upputuri, Paul Kumar, Gong, Li, Wang, Haifeng, Pramanik, Manojit, Nandigana, Krishna Mohan, Kothiyal, Mahendra Prasad   +5 more
openaire   +1 more source

Eliminating the influence of head and eye movements on the estimation of tear film surface parameters in lateral shearing interferometry. [PDF]

Biomed Opt Express
Szczesna-Iskander DH, Robert Iskander D.
europepmc   +1 more source

Spectral Super-Resolution Technology Based on Fabry-Perot Interferometer for Temporally and Spatially Modulated Fourier Transform Imaging Spectrometer. [PDF]

Sensors (Basel)
Zhang Y, Lv Q, Wang J, Tang Y, Si J, Chen X, Liu Y.   +6 more
europepmc   +1 more source

Intelligent single-shot full-field characterization over femtosecond pulses. [PDF]

Nat Commun
Pu G, Luo C, Hu W, Yi L.
europepmc   +1 more source

White-light colorimetric interferometry for measurement of thickness and topography on semiconductor structures. [PDF]

Sci Rep
Im J, Lee H, Jang K, Choi S.
europepmc   +1 more source

Tropical peatland restoration evaluation using time-series L-band InSAR analysis. [PDF]

Sci Rep
Zahro Q, Izumi Y, Novresiandi DA, Cahyana D, Widodo J, Ito D, Ota K, Dong M.   +7 more
europepmc   +1 more source

Broadband photon-counting dual-comb spectroscopy with attowatt sensitivity over turbulent optical paths. [PDF]

Light Sci Appl
Zhong W, Liu Y, Yin Q, Zhao R, Wang C, Ren W, Dou X, Xue X.   +7 more
europepmc   +1 more source

Phase Characterization of Singular Metasurfaces. [PDF]

ACS Photonics
Tahmi Y, Ansquer M, Coulon PM, Chenot S, Brändli V, Majorel C, Patoux A, Colom R, Wattellier B, Genevet P, Khadir S.   +10 more
europepmc   +1 more source