Results 251 to 252 of about 104,312 (252)

A Review of Optical Interferometry for High-Precision Length Measurement

Micromachines
Guochao Wang, Xinghui Li, Shuhua Yan
exaly  

A review of recent work in sub-nanometre displacement measurement using optical and X–ray interferometry

Philosophical Transactions Series A, Mathematical, Physical, and Engineering Sciences, 2002
exaly