Results 151 to 160 of about 160,647 (318)

6  MeV heavy ion beam probe on the Large Helical Device [PDF]

open access: bronze, 2006
T. Ido   +11 more
openalex   +1 more source

Crack‐Growing Interlayer Design for Deep Crack Propagation and Ultrahigh Sensitivity Strain Sensing

open access: yesAdvanced Functional Materials, EarlyView.
A crack‐growing semi‐cured polyimide interlayer enabling deep cracks for ultrahigh sensitivity in low‐strain regimes is presented. The sensor achieves a gauge factor of 100 000 at 2% strain and detects subtle deformations such as nasal breathing, highlighting potential for minimally obstructive biomedical and micromechanical sensing applications ...
Minho Kim   +11 more
wiley   +1 more source

Magnetic and Structural Response Tuned by Coexisting Mn Concentration‐Dependent Phases in MnBi2Te4 Thin Film Grown on GaAs(001) by Molecular Beam Epitaxy

open access: yesAdvanced Functional Materials, EarlyView.
The study explores structural and magnetic properties of one of the most recent topological quantum materials (MnBi2Te4). The Mn‐poor structure leads to stacking faults (quintuple layer ‐ QL of Bi2Te3 formation instead of a septuple layer ‐ SL of MnBi2Te4), resulting in a coexistence between weak antiferromagnetism and ferromagnetism.
Wesley F. Inoch   +10 more
wiley   +1 more source

Observation of accelerated beam ion population during edge localized modes in the ASDEX Upgrade tokamak

open access: green, 2019
J. Galdón-Quiroga   +13 more
openalex   +2 more sources

Nano Josephson Superconducting Tunnel Junctions in Y-Ba-Cu-O Direct- Patterned with a Focused Helium Ion Beam [PDF]

open access: green, 2014
Shane A. Cybart   +6 more
openalex   +1 more source

In Situ Study of Resistive Switching in a Nitride‐Based Memristive Device

open access: yesAdvanced Functional Materials, EarlyView.
In situ TEM biasing experiment demonstrates the volatile I‐V characteristic of MIM lamella device. In situ STEM‐EELS Ti L2/L3 ratio maps provide direct evidence of the oxygen vacancies migrations under positive/negative electrical bias, which is critical for revealing the RS mechanism for the MIM lamella device.
Di Zhang   +19 more
wiley   +1 more source

The impact of carbon-ion beam irradiation on the phenotypic and molecular variation of wheat. [PDF]

open access: yesBMC Plant Biol
Fan H   +11 more
europepmc   +1 more source

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