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Philosophical Transactions of the Royal Society of London. Series A: Mathematical, Physical and Engineering Sciences, 1999
Fusion faces three types of challenge: scientific, economic, and environmental. Many scientists believe that both inertial and magnetic fusion can meet the scientific challenge in the sense that th...
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Fusion faces three types of challenge: scientific, economic, and environmental. Many scientists believe that both inertial and magnetic fusion can meet the scientific challenge in the sense that th...
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Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 1994
Abstract Bombardment of surfaces with ions of energy below the penetration threshold enables film growth to occur under uniquely controlled conditions. The ion beam deposition technique has been used to grow epitaxial thin films at low temperatures and to synthesise a variety of compound materials such as oxides, nitrides and silicides at surfaces ...
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Abstract Bombardment of surfaces with ions of energy below the penetration threshold enables film growth to occur under uniquely controlled conditions. The ion beam deposition technique has been used to grow epitaxial thin films at low temperatures and to synthesise a variety of compound materials such as oxides, nitrides and silicides at surfaces ...
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Nuclear Instruments and Methods in Physics Research Section B: Beam Interactions with Materials and Atoms, 2008
The Ion Beam Analysis (IBA) techniques are powerful tools to investigate the composition of a material in a non-destructive way. Ion beams impinging on a material induce several processes simultaneously which lead to emission of secondary radiation and particles as illustrated in Fig. 3.1.
Anand P. Pathak +2 more
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The Ion Beam Analysis (IBA) techniques are powerful tools to investigate the composition of a material in a non-destructive way. Ion beams impinging on a material induce several processes simultaneously which lead to emission of secondary radiation and particles as illustrated in Fig. 3.1.
Anand P. Pathak +2 more
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2007
The field of ion beam mixing studies the compositional and structural changes of a two or multiple component system under the influence of ion irradiation. Due to these changes, material properties of the system may be modified in ways sometimes difficult to achieve by conventional methods.
Michael Nastasi, James W. Mayer
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The field of ion beam mixing studies the compositional and structural changes of a two or multiple component system under the influence of ion irradiation. Due to these changes, material properties of the system may be modified in ways sometimes difficult to achieve by conventional methods.
Michael Nastasi, James W. Mayer
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1999
The use of high energy ion beams (mainly of protons or alpha particles) for chemical analysis is described. The equipment necessary for achieving this is summarized. The main detection systems are proton-induced X-ray emission (PIXE), Rutherford backscattering (RBS) and nuclear reaction analysis (NRA). © 1999 Elsevier Ltd All rights reserved.
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The use of high energy ion beams (mainly of protons or alpha particles) for chemical analysis is described. The equipment necessary for achieving this is summarized. The main detection systems are proton-induced X-ray emission (PIXE), Rutherford backscattering (RBS) and nuclear reaction analysis (NRA). © 1999 Elsevier Ltd All rights reserved.
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Physics in Technology, 1980
Report on 4th international conference on ion beam analysis, 25-29 June 1979 at the Institute of Physics, University of Aarhus, Denmark.
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Report on 4th international conference on ion beam analysis, 25-29 June 1979 at the Institute of Physics, University of Aarhus, Denmark.
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Vakuum in Forschung und Praxis, 2018
SummaryFocussed Ion Beam ‐“Cutting Edge” Technology of Material AnalysisWith the focussed ion beam technique it is possible to sputter almost any material with nanometer scale accuracy and directly image or chemically analyze structures below the surface.
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SummaryFocussed Ion Beam ‐“Cutting Edge” Technology of Material AnalysisWith the focussed ion beam technique it is possible to sputter almost any material with nanometer scale accuracy and directly image or chemically analyze structures below the surface.
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MRS Bulletin, 1987
Ion beams are used extensively in materials research for processing and synthesis as well as for characterization. In the last few years, enormous advances have been made regarding the use of ion beams for processing or synthesis, and this issue of the MRS BULLETIN will review some of those advances. (The use of ion beams for materials characterization
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Ion beams are used extensively in materials research for processing and synthesis as well as for characterization. In the last few years, enormous advances have been made regarding the use of ion beams for processing or synthesis, and this issue of the MRS BULLETIN will review some of those advances. (The use of ion beams for materials characterization
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1983
Ion-beam lithography is a potential method for producing patterns in photoresist with a higher resolution than that of electron-beam or x-ray lithography. In this paper, the advantages and limitations of ion-beam lithography in respect to resist sensitivity, ranges and lateral speed of ions, as well as resolution, will be discussed.
H. Ryssel, K. Haberger
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Ion-beam lithography is a potential method for producing patterns in photoresist with a higher resolution than that of electron-beam or x-ray lithography. In this paper, the advantages and limitations of ion-beam lithography in respect to resist sensitivity, ranges and lateral speed of ions, as well as resolution, will be discussed.
H. Ryssel, K. Haberger
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